Localizing and orienting probe for view devices

• US 5,999,837 A
• Filed: 09/26/1997
• Issued: 12/07/1999
• Est. Priority Date: 09/26/1997
• Status: Expired due to Term

• Current Assignee: MAKO Surgical Corporation (Stryker Corporation)
• Original Assignee: Picker International, Inc. (Marconi Holdings Company Limited)
• Inventors: Schellenberg, John D., Messner, Dale A., Dayton, Patrick A.
• Primary Examiner(s): Lateef, Marvin M.
• Assistant Examiner(s): Imam, Ali M.
• Application Number:
  US08/938,209
• Time in Patent Office: 802 Days
• Field of Search: 600/407, 600/415, 600/424, 606/130, 359/368
• US Class Current: 600/407
• CPC Class Codes: A61B 2090/3945 Active visible markers, e.g. light emitting diodes
• CPC Class Codes: A61B 2090/3983 Reference marker arrangements for use with image guided surgery
• CPC Class Codes: A61B 90/20 Surgical microscopes characterised by non-optical aspects
• CPC Class Codes: G02B 21/0012 Surgical microscopes counterbalanced structures for surgical microscopes G02B7/001

Abstract

A microscope calibrator probe includes a handle, a tool head connected to the handle, a viewable target connected to an end of the tool head opposite the handle, and three or more position signaling devices disposed on the handle for tracking the probe in an image guided surgery system. The tool head includes a bend of approximately 90 degrees to provide easy placement of the viewable target on an object being viewed below a microscope. Other angles for the bend are also acceptable. A precise location of the object being viewed is determined by sensing a location the three or more position signaling devices disposed on the handle with respect to an operating room reference frame and knowing an offset between the position signaling devices and a bottom surface of the viewable target in contact with the object. Additionally, the viewable target includes a viewable aperture for calibrating a line of sight of the microscope and a means for indicating a rotational sense of the viewable target.

Claims

1. An apparatus for use with a surgical microscope, the apparatus comprising:

a target for placement on an object of interest in known relationship with a focal axis of the surgical microscope, the target including means, when viewed through the microscope, for providing a visual indication when the visual indication providing means is in alignment with the focal axis of the microscope; and

means for communicating signals indicative of the location of the target.

2. The apparatus of claim 1 wherein the means for communicating the location of the target includes a position indicator having a known location with respect to the target.

3. The apparatus of claim 2 wherein the position indicator includes a plurality of infrared emitters.

4. The apparatus of claim 2 wherein the position indicator includes a plurality of passive devices.

5. The apparatus of claim 2 wherein the position indicator is disposed on a first surface of a support assembly associated with the target.

6. The apparatus of claim 5 including a second surface of the support assembly and the position indicator is mounted to the support assembly in a manner to communicate the position of the target from both the first and second surfaces of the support assembly.

7. The apparatus of claim 5 wherein the support assembly includes a handle to which the position indicators are mounted.

8. The apparatus of claim 7 wherein a tool head is attached between the target and the handle.

9. The apparatus of claim 8 wherein the tool head comprises a shaft with a bend.

10. The apparatus of claim 9 wherein the bend is substantially 90 degrees.

11. The apparatus of claim 1 wherein the target includes a second surface opposite the first surface, a material free region extending through the target from the first surface to second surface wherein the configuration of the material free region is adapted for aligning the target along the focal axis of microscope.

12. The apparatus of claim 11 wherein the means for communicating defines a plane and an axis of the material free region is substantially parallel with the plane.

13. The apparatus of claim 12 wherein the contact surface is substantially orthogonal to the plane.

14. The apparatus of claim 11 wherein the material free region is an aperture in the target.

15. The apparatus of claim 14 wherein the size of the aperture is adapted to accommodate the magnification power of the microscope.

16. The apparatus of claim 1 wherein the signals indicative of the location of the target includes signals indicative of at least one of the distance of the contact surface from the surgical microscope, the alignment of the target with the focal axis of the surgical microscope and the rotational orientation of the target with respect to the surgical microscope.

17. The apparatus of claim 16 wherein the rotational orientation of the target is indicated by a mark on the target.

18. A system for determining an attribute of a microscope, the system comprising:

a tool including;

a target for placement on an object of interest in known relationship with a focal axis of the microscope, the target including a material free region adapted to provide a visual indication when viewed through the microscope when the target is in said known relationship to said focal axis of the surgical microscope;

means for supporting the target; and

a plurality of position signaling devices having a known relationship to the target;

means for tracking the plurality of position signaling devices; and

means for processing information tracked by the means for tracking.

19. The system according to claim 18, wherein the means for supporting the target is a tool head.

20. The system according to claim 19, comprising at least three position signaling devices disposed on a first surface of the handle.

21. The system according to claim 20, wherein the tool head includes a bend.

22. The system according to claim 21, wherein the bend is substantially 90 degrees.

23. The system according to claim 22, wherein the target includes a viewing aperture defining a viewing axis.

24. The system according to claim 18, wherein the means for tracking the plurality of position signaling devices is a localizer.

25. The system according to claim 24, wherein the means for processing information tracked is a computer system.

26. A method of determining an attribute of a microscope comprising the steps of:

focusing the microscope on an object in a field of view of the microscope;

positioning a target that includes visual indicating means for indicating when the indicating means is aligned with the focal axis of the microscope;

observing the visual indicating means through the microscope;

aligning the visual indicating means with the focal axis of the microscope; and

sensing the position of the target in relation to the microscope.

27. The method according to claim 26, wherein the target includes a viewing aperture defining a viewing axis and wherein the step of positioning the target on the object includes the step of:

aligning the microscope with the viewing axis such that at least a portion of the object is viewable through the viewable aperture.

28. The method according to claim 26, wherein the target is coupled to an end of a tool head of a surgical tool.

29. A method of calibrating a microscope in an image guided surgery system, comprising the steps of:

focusing the microscope on an object of interest;

positioning a target having means for indicating a rotational sense of the target in contact with an object of interest viewed by the microscope such that the means for indicating the rotational sense of the target is aligned with a desired rotational sense of the microscope;

aligning the view of the microscope with the means for indicating the rotational sense of the target; and

using the image guided surgery system to determine a position of the target and calibrate the microscope.

30. The method according to claim 29, wherein the target is coupled to an end of a tool head of a surgical tool.