High resolution scanning raman microscope
First Claim
1. A scanning microscope for obtaining high-resolution spectroscopic information, the microscope comprising:
- a support stage, having surfaces for supporting a sample;
a first optical apparatus for directing an optical beam at the sample;
a second optical apparatus for collecting light emitted from the sample to reduce the background noise;
a spectral dissociating apparatus coupled to said second optical apparatus to dissociate light emitted from the sample for analysis;
a probe supporting a conductive element at a location within the optical beam area, the conductive element being configured to enhance emission of light from molecules in the vicinity of the conductive element; and
a probe height detection apparatus operatively connected with said probe to generate detection signals representing surface topography, said probe height detection apparatus detecting a change in surface profile by differencing a reference beam from a reflected signal of the reference beam.
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Abstract
A method of obtaining high-resolution spectroscopic information from a scanning microscope. An optical beam is directed at a sample and light emitted from the sample (e.g., from Raman scattering or fluorescence) is collected. Resolution is improved by supporting a tiny conductive element (e.g., a silver particle) from a probe located within the optical beam area. The conductive element enhances the light emitted from molecules in the vicinity of the probe. The invention provides the high spatial resolution of microscopes such as the AFM with the high chemical detection sensitivity of surface enhanced Raman spectroscopy. This combination allows the isolation and differentiation of single molecules on surfaces of nanostructures.
242 Citations
52 Claims
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1. A scanning microscope for obtaining high-resolution spectroscopic information, the microscope comprising:
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a support stage, having surfaces for supporting a sample; a first optical apparatus for directing an optical beam at the sample; a second optical apparatus for collecting light emitted from the sample to reduce the background noise; a spectral dissociating apparatus coupled to said second optical apparatus to dissociate light emitted from the sample for analysis; a probe supporting a conductive element at a location within the optical beam area, the conductive element being configured to enhance emission of light from molecules in the vicinity of the conductive element; and a probe height detection apparatus operatively connected with said probe to generate detection signals representing surface topography, said probe height detection apparatus detecting a change in surface profile by differencing a reference beam from a reflected signal of the reference beam. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29)
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30. A method of obtaining high-resolution spectroscopic and surface topographic information of a sample, the method comprising:
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supporting the sample on a support stage; directing an optical beam at the sample; collecting light emitted from the sample through a series of filtering mechanisms to reduce the background noise; spectrally dissociating light emitted from the sample; supporting a conductive element from a probe at a location within the optical beam area, the conductive element being configured to enhance the light emitted from molecules in the vicinity of the conductive element; generating a reference beam using a laser and coupling the reference beam to the probe; receiving perturbations of the reference beam caused by the surface of the sample from the probe and transmitting the perturbations as a reflected signal; and generating surface topography by differencing the reference beam from the reflected signal. - View Dependent Claims (31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52)
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Specification