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Methods to control the environment and exposure apparatus

  • US 6,002,987 A
  • Filed: 03/26/1997
  • Issued: 12/14/1999
  • Est. Priority Date: 03/26/1996
  • Status: Expired due to Fees
First Claim
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1. A method of controlling the environment of an exposure system for use in making semiconductor circuits using photolithography comprising the steps of:

  • detecting a noise in a chamber in which an exposure system for transferring a pattern of a mask onto a substrate is housed; and

    controlling an operational environment of said exposure system by generating sounds of opposite phase to the detected noise, whereby vibration of said exposure system is substantially prevented.

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