Oscillation-based test method for testing an at least partially analog circuit

• US 6,005,407 A
• Filed: 10/23/1995
• Issued: 12/21/1999
• Est. Priority Date: 10/23/1995
• Status: Expired due to Fees

• Current Assignee: Opmax Inc.
• Original Assignee: Opmax Inc.
• Inventors: Arabi, Karim, Kaminska, Bozena
• Primary Examiner(s): Nguyen, Vinh P.
• Application Number:
  US08/546,806
• Time in Patent Office: 1,520 Days
• Field of Search: 324/73.1, 324/158.1, 324/763, 324/765, 371/22.1, 371/22.3, 371/22.6, 371/15.1, 371/25.1, 371/22.5, 438/14, 438/17, 257/40, 257/48
• US Class Current: 324/762.02
• CPC Class Codes: G01R 31/2824 testing of oscillators or resonators
• CPC Class Codes: G01R 31/2851 Testing of integrated circuits [IC] G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801
• CPC Class Codes: G01R 31/3167 Testing of combined analog and digital circuits testing ADC's H03M1/1071
• CPC Class Codes: G01R 31/31707 Test strategies methods for generation of test sequences G01R31/318371

Abstract

The oscillation-based test method and device is applied to at least partially analog circuits. The at least partially analog circuit is first divided into building blocks each having a given structure. Each building block is then inserted into an oscillator circuit to produce an output signal having an oscillation frequency related to the structure of the building block under test. The oscillation frequency is then measured and a fault in the building block under test is detected when the measured oscillation frequency deviates from a given, nominal frequency. Experiments have demonstrated that the frequency deviation enables the detection of catastrophic and/or parametric faults, and ensures a high fault coverage. In this new time-domain test method, a single output frequency is evaluated for each building block whereby the test duration is very short. These characteristics make the test strategy very attractive for wafer-probe testing as well as final production testing.

Claims

1. An oscillation-based test method for testing an at least partially analog circuit, comprising the steps of:

(a) dividing said at least partially analog circuit into building blocks each having a given structure;

(b) connecting to at least one of the building blocks additional circuitry forming with said at least one building block an oscillator circuit producing an output signal, wherein said at least one building block is under test, and wherein the output signal has an oscillation frequency having a frequency value related to the given structure of said at least one building block under test;

(c) measuring the oscillation frequency of said output signal; and

(d) detecting a fault in said at least one building block under test when the measured oscillation frequency deviates from a given, nominal frequency.

2. An oscillation-based test method as recited in claim 1, wherein said fault detecting step comprises detecting catastrophic and/or parametric faults in response to a deviation of the measured oscillation frequency from said given, nominal frequency.

3. An oscillation-based test method as recited in claim 1, wherein said measuring step comprises the step of converting the oscillation frequency of said output signal into a frequency representative number.

4. An oscillation-based test method as recited in claim 3, wherein said fault detecting step comprises the steps of:

comparing the frequency representative number to a given, nominal number; and

detecting a fault in said at least one building block under test when the frequency representative number deviates from said given, nominal number.

5. An oscillation-based test method as recited in claim 3, wherein said converting step comprises the steps of:

detecting passages of said output signal by a zero amplitude to produce a square wave clock signal including a series of pulses; and

counting the pulses of said square wave clock signal to produce the frequency representative number.

6. An oscillation-based test method as recited in claim 1, wherein said connecting step further comprises the step of combining at least two of said building blocks to form said oscillator circuit.

7. An oscillation-based test method as recited in claim 1, wherein said at least partially analog circuit is an integrated circuit, and wherein said oscillation-based test method further comprises the step of integrating said additional circuitry into said integrated circuit.

8. An oscillation-based test method as recited in claim 7, wherein said connecting step comprises the step of connecting said additional circuitry to said at least one building block under test through switching elements, and wherein said oscillation-based test method further comprises the step of opening said switching elements to disconnect said additional circuitry from said at least one building block under test when said fault detecting step is completed.

9. An oscillation-based test method as recited in claim 1, wherein said fault detecting step comprises producing a fail signal when the measured oscillation frequency deviates from said given, nominal frequency, and producing a pass signal when the measured oscillation frequency corresponds to said given, nominal frequency.

10. An oscillation-based test method as recited in claim 1, comprising repeating steps (b), (c) and (d) for testing different building blocks.

11. An oscillation-based test method as recited in claim 1, comprising repeating steps (b), (c) and (d) for testing different groups of said building blocks.

12. A device for testing an at least partially analog circuit divided into building blocks each having a given structure, comprising:

means for connecting to at least one of the building blocks additional circuitry forming with said at least one building block an oscillator circuit producing an output signal, wherein said at least one building block is under test, and wherein the output signal has an oscillation frequency having a frequency value related to the given structure of said at least one building block under test;

means for measuring the oscillation frequency of said output signal; and

means for detecting a fault in said at least one building block under test when the measured oscillation frequency deviates from a given, nominal frequency.

13. The device of claim 12, wherein said fault detecting means comprises means for detecting catastrophic and/or parametric faults in response to a deviation of the measured oscillation frequency from said given, nominal frequency.

14. The device of claim 12, wherein said measuring means comprises a frequency-to-number converter for converting the oscillation frequency of said output signal into a frequency representative number, and wherein said fault detecting means comprises a control logic for comparing the frequency representative number to a given, nominal number and for detecting a fault in said at least one building block under test when the frequency representative number deviates from said given, nominal number.

15. The device of claim 14, wherein said frequency-to-number converter comprises a zero crossing detector for detecting passages of said output signal by a zero amplitude to produce a square wave clock signal including a series of pulses, and a counter for counting the pulses of said square wave clock signal to produce the frequency representative number.

16. The device of claim 12, wherein said fault detecting means comprises a control logic for producing a fail signal when the measured oscillation frequency deviates from said given, nominal frequency, and for producing a pass signal when the measured oscillation frequency corresponds to said given, nominal frequency.

17. The device of claim 12, wherein said connecting means comprises means for successively connecting said additional circuitry to different building blocks in order to test said different buildings blocks with the same additional circuitry.