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Method for characterizing interconnect timing characteristics

  • US 6,005,829 A
  • Filed: 05/21/1998
  • Issued: 12/21/1999
  • Est. Priority Date: 09/17/1996
  • Status: Expired due to Term
First Claim
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1. A method of determining interconnect timing characteristics of a test interconnect structure, the method comprising:

  • a. determining a first timing characteristic of a reference logic unit and a reference interconnect structure;

    b. connecting the test interconnect structure to the reference interconnect structure;

    c. measuring a second timing characteristic of the reference logic unit and reference interconnect structures connected to the test interconnect structure;

    d. comparing the first and second timing characteristics to determine a time value; and

    e. determining the interconnect timing characteristics of the test interconnect structure based on the time value and the first and second timing characteristics of the reference interconnect structure;

    f. wherein the timing characteristics of the test interconnect structure represent capacitance values based on an interconnect model representative of the test interconnect structure.

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