×

Test system with robot arm for delivering a device under test

  • US 6,008,636 A
  • Filed: 09/30/1997
  • Issued: 12/28/1999
  • Est. Priority Date: 09/30/1997
  • Status: Expired due to Term
First Claim
Patent Images

1. A test system for testing electronic devices, the test system comprising:

  • a frame comprising a base, a canopy, and a test area positioned therebetween;

    a plurality of test equipment housed in the base and the canopy;

    a conveyor system housed in the test area to convey the electronic devices;

    a vision guidance system housed in the test area to locate one of the electronic devices;

    a plurality of test fixtures housed in the test area, each of the plurality of test fixtures coupled to a corresponding one of the plurality of test equipment; and

    a robot apparatus comprising a robot arm and a robot controller, the robot arm mounted in the test area and having a plurality of rotational joints, the robot controller coupled to the plurality of test equipment, the conveyor system, and the vision guidance system, the robot controller, responsive to the vision guidance system, to control the robot arm to deliver the one of the electronic devices from the conveyor system to one of the plurality of test fixtures.

View all claims
  • 4 Assignments
Timeline View
Assignment View
    ×
    ×