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Method for developing circuit capacitance measurements corrected for stray capacitance

  • US 6,008,660 A
  • Filed: 08/22/1996
  • Issued: 12/28/1999
  • Est. Priority Date: 08/22/1996
  • Status: Expired due to Fees
First Claim
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1. A method for measuring capacitance on an object containing electrical circuits, said method comprising:

  • positioning one of a plurality of movable probes in electrical contact with a selected test point on said object, said probes being movable relative to both each other and said object;

    applying a reference potential to a reference point on said object that is remote from said selected test point;

    utilizing said one of said movable probes, taking a measurement of capacitance with said one of said movable probes in contact with said selected test point, said capacitance being measured between said selected test point and said reference point; and

    applying a correction to said first capacitance measurement;

    said correction serving to correct for stray capacitance between said one of said probes in contact with said selected test point and others of said plurality of movable probes.

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