Method for developing circuit capacitance measurements corrected for stray capacitance

• US 6,008,660 A
• Filed: 08/22/1996
• Issued: 12/28/1999
• Est. Priority Date: 08/22/1996
• Status: Expired due to Fees

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Mahlbacher, James Christopher
• Primary Examiner(s): Karlsen, Ernest F.
• Assistant Examiner(s): DO, DIEP N
• Application Number:
  US08/701,621
• Time in Patent Office: 1,223 Days
• Field of Search: 324/601, 324/672, 324/679, 324/684, 324/687, 324/688, 324/663, 324/225, 324/207.12
• US Class Current: 324/661
• CPC Class Codes: G01R 27/2605 Measuring capacitance capacitive sensors G01D5/24

Abstract

Accuracy of capacitance measurements taken with flying probes--probes that are movable relative to each other and surfaces of an object containing circuits being tested (e.g. a printed circuit board)--is improved by dynamically applying corrections for stray capacitance as individual probes are selected for measurements. Measuring circuitry to which the probes are linked includes multiplexor circuitry. The latter stray capacitance encompassing the stray capacitance between the one movable probe and the other movable probes as well as the cabling between the latter probes and the multiplexor circuitry. For these measurements, the reference point is contacted either by a fixed conductor or another one of the movable probes (other than the probe aligned with the test point) that is currently usable for that purpose. As the one movable probe is moved into alignment with the test point, while out of contact with the object, a first capacitance measurement is taken and saved; that measurement representing the stray capacitance between that one probe and both the reference point and the other probes. The one probe is then moved into contact with the respective test point and a second capacitance measurement is taken and saved; that measurement representing capacitance between the respective test point and the reference point. The saved first measurement is subtracted from the saved second measurement, and the result is saved as a corrected measurement; i.e. a measure of the capacitance between the respective test point and reference point, corrected for all relevant stray capacitances.

Claims

1. A method for measuring capacitance on an object containing electrical circuits, said method comprising:

positioning one of a plurality of movable probes in electrical contact with a selected test point on said object, said probes being movable relative to both each other and said object;

applying a reference potential to a reference point on said object that is remote from said selected test point;

utilizing said one of said movable probes, taking a measurement of capacitance with said one of said movable probes in contact with said selected test point, said capacitance being measured between said selected test point and said reference point; and

applying a correction to said first capacitance measurement;

said correction serving to correct for stray capacitance between said one of said probes in contact with said selected test point and others of said plurality of movable probes.

2. A method for measuring capacitance in accordance with claim 1 wherein said correction for stray capacitance is obtained by taking a capacitance measurement with said one of said movable probes lying over but removed from electrical contact with said selected test point, and subtracting said capacitance measurement with said one of said movable probes lying over but removed from electrical contact with said selected test point from said measurement of capacitance with said one of said movable probes in contact with said selected test point.

3. A method for measuring capacitance in accordance with claim 2 wherein:

said capacitance measurement with said one of said movable probes lying over but removed from electrical contact with said selected test point is taken before said measurement of capacitance with said one of said movable probes in contact with said selected test point;

representations of both said capacitance measurement with said one of said movable probes lying over but removed from electrical contact with said selected test point and said measurement of capacitance with one of said movable probes in contact with said selected test point are saved as the respective measurements are taken;

said representation of said capacitance measurement with said one of said movable probes lying over but removed from electrical contact with said selected test point is subtracted from said saved representation of said measurement of capacitance with said one of said movable proves in contact with said selected test point to form a difference saved as a corrected capacitance measurement.

4. A method for measuring capacitance in accordance with claim 1 wherein said reference potential is applied to said reference point on said object via a fixed conductor separate from said plurality of movable probes.

5. A method for measuring capacitance in accordance with claim 1 wherein said reference potential is applied to said reference point on said object via one of said other movable probes that is instantly near said reference point while said one of said movable probes is being placed in contact with said selected test point.

6. A method for measuring capacitance comprising:

positioning one of a plurality of movable probes in alignment with a selected test point on a stationary object;

said probes being movable relative to each other and said object;

taking a first capacitance measurement with said one of said movable probes removed from contact with said selected test point;

said first measurement representing stray capacitance between said one of said movable probes and other said movable probes, as well as stray capacitance between said one of said movable probes and a predetermined reference point on said object;

said test point and reference point being discretely separated from each other;

saving said first capacitance measurement;

taking a second capacitance measurement with said one of said movable probes contacting said test point;

said second measurement representing the capacitance between said test point and said reference point; and

subtracting said first saved measurement from said second measurement to produce a resulting capacitance value representing the capacitance between said test point and said reference point corrected for stray capacitances currently existing between said one of said movable probes and other said movable probes as well as between said one of said movable probes and said reference point.

7. A method for measuring capacitance in accordance with claim 6 wherein said first and second capacitance measurements are taken in succession as said one of said movable probes is first moved into alignment with said test point, while removed from contact with said object, and then moved into contact with said test point.

8. A method for measuring capacitance in accordance with claim 6 wherein said first and second capacitance measurements are taken successively, by a measuring system connected to all of said movable probes, and each measurement is saved;

and wherein said saved first measurement is subtracted from said saved second measurement to produce said resulting capacitance value corrected for stray capacitance.