Method and apparatus for materials analysis by enhanced laser induced plasma spectroscopy

• US 6,008,897 A
• Filed: 01/19/1999
• Issued: 12/28/1999
• Est. Priority Date: 01/19/1999
• Status: Expired due to Fees

• Current Assignee: National Research Council Canada
• Original Assignee: National Research Council Canada
• Inventors: Cielo, Paolo, St-Onge, Louis, Sabsabi, Mohamad
• Primary Examiner(s): EVANS, FANNIE L
• Application Number:
  US09/232,722
• Time in Patent Office: 343 Days
• Field of Search: 356/317, 356/318
• US Class Current: 356/318
• CPC Class Codes: G01N 21/718 Laser microanalysis, i.e. with formation of sample plasma

Abstract

A method and apparatus is disclosed for enhanced laser-induced plasma spectroscopic analysis of unknown heterogeneous materials. The apparatus has high power pulsed lasers with their beams focused on the material, typically two colinear lasers providing two pulses in the ultraviolet and in the near infrared spectral area. The first laser pulse vaporizes a small volume at the surface of the material and produces a plasma which is subsequently enhanced by the second laser pulse. The optical emission of the plasma is analyzed with a colinear optical spectrometer. The pulsed spectrum is detected by a gated photodiode array detector or by an array of photomultipliers each individually positioned to detect a line emission representative of a given element present in the material. The combination of the two laser pulses, appropriately synchronized, provides a plasma emission that is significantly stronger than a single laser pulse of the combined energy of the two pulses.

Claims

1. A method for spectroscopic analysis of a heterogeneous material, the method comprising:

a) directing a first single high intensity laser pulse at the surface of said material to generate an ionized plasma,

b) waiting a time period that is shorter than sufficient for said plasma to lose its ionization, then

c) directing a second single high intensity laser pulse at the plasma generated by the first pulse collinearly with said first pulse, said second pulse being of a wavelength substantially longer than the wavelength of said first laser pulse, to enable at least partial absorption of the energy of said second pulse by said plasma and to create an enhanced plasma containing radiation which is representative of a selected component present in said material,

d) measuring the intensity of said radiation of said enhanced plasma collinearly with said first laser pulse and said second laser pulse, and

e) determining the concentration of said selected component in said material as a function of said intensity of said radiation.

2. The method of claim 1 wherein said predetermined time period is between about 0.1 and about 5 microseconds.

3. The method according to claim 1 wherein the step e) is effected by comparing said intensity of said elemental radiation with a known radiation intensity of said element.

4. The method of claim 3 wherein said comparison is effected using a calibration curve obtained by recording normalized signal levels corresponding to samples with predetermined varying elemental concentrations.

5. The method of claim 1 wherein said first and second pulses are generated by two colinear lasers respectively.

6. The method of claim 1 wherein said first and second pulses are generated by a single laser.

7. The method of claim 1 wherein said first pulse has a wavelength in the UV range and the second pulse has a wavelength in the IR range.

8. The method of claim 1 wherein said first pulse has a wavelength in the UV range and the second pulse has a wavelength in the visible range.

9. The method of claim 1 wherein said first pulse has a wavelength in the visible range and the second pulse has a wavelength in the IR range.

10. The method of claim 1 wherein said first pulse has a wavelength in the near-IR range and the second pulse has a wavelength in the far-IR range.

11. An apparatus for laser-induced spectroscopic analysis of a heterogeneous material, the apparatus comprising:

means for emitting two collinear sequential laser pulses temporally spaced by a predetermined time period, the wavelength of said second pulse being substantially loner than the wavelength of said first pulse,

means for focusing a first of said two pulses on the surface of said material to generate a plasma of said material,

means for focusing a second of said two pulses on said plasma to generate an enhanced plasma emitting an optical radiation containing radiation which is representative of a selected component of said heterogeneous material,

measuring means disposed collinearly with said emitting means for measuring said optical radiation of said enhanced plasma after the second laser pulse, and

data processing means for determining the concentration of said component in said material.

12. The apparatus of claim 11 where said emitting means are two effectively colinear lasers.

13. The apparatus of claim 11 where said emitting means is a single laser.

14. The apparatus of claim 11 where said measuring means is an optical spectrometer.

15. The apparatus of claim 14 wherein said spectrometer comprises an enhanced gated photodiode array of detectors.

16. The method of claim 14 where said spectrometer comprises an array of individually positioned photomultipliers.