Method and apparatus for the automatic inspection of optically transmissive planar objects

• US 6,011,620 A
• Filed: 04/06/1998
• Issued: 01/04/2000
• Est. Priority Date: 04/06/1998
• Status: Expired due to Fees

• Current Assignee: Perceptics LLC
• Original Assignee: Northrop Grumman Corporation
• Inventors: Sites, Peter Winston, Nelms, Anthony Scott
• Primary Examiner(s): Pham, Hoa Q.
• Application Number:
  US09/055,536
• Time in Patent Office: 638 Days
• Field of Search: 356/237, 356/239, 356/240, 356/429-431, 250/223 B, 250/559.42
• US Class Current: 356/239.1
• CPC Class Codes: G01N 21/896 Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod for other objects G01N21/958

Abstract

Inspection apparatus for determining defects in a planar light transmissive object. A diffuse light is projected through a mask toward an object under test at an inspection location. A digital video camera observes the inspection location and obtains images of the object. These images are examined and processed by a signal processor to obtain indications of various defects. The mask utilized is of a selected design having either multiple alternating narrow clear and opaque stripes, or a single narrow clear stripe straddled by opaque regions or a single narrow opaque stripe straddled by clear regions.

Claims

1. Apparatus for determining defects in an optically transmissive planar object, comprising:

(A) a camera having a sensor array for obtaining images of said object, said camera having an optical axis;

(B) a light source positioned to direct light at said camera along said optical axis;

(C) an object inspection location for receiving said object and disposed between said camera and said light source, said planar object being located at an object plane with said camera being focused at a position that is within the distance of several millimeters from said object plane;

(D) a mask positioned in the light path between said light source and said inspection location;

(E) said mask having a stripe design selected from the group consisting of a) a narrow clear stripe, for allowing transmission of said light, and straddled by opaque regions which block transmission of said light, b) a narrow opaque stripe straddled by clear regions and c) alternating narrow clear and opaque stripes of a spacing that will cyclically generate a uniform background through interference phenomenon in the region between said mask and said camera;

(F) said camera being operable to obtain an image of said object with a selected one of said masks in position; and

(G) means for processing said images to obtain indications of said defects.

2. Apparatus according to claim 1 wherein:

(A) said light source provides monochromatic light.

3. Apparatus according to claim 2 wherein:

(A) said mask is comprised of alternating narrow clear and opaque stripes; and

wherein

(B) said camera includes a planar sensor array to obtain an XY image;

(C) said camera is focused at an object plane wherein the pattern of said mask appears as essentially uniform; and

(D) said object is at a position displaced from said object plane.

4. Apparatus according to claim 3 wherein:

(A) said object is above said object plane.

5. Apparatus according to claim 4 wherein:

(A) said stripes are parallel.

6. Apparatus according to claim 1 which includes:

(A) means for moving said object into said inspection location.

7. Apparatus according to claim 1 wherein:

(A) said mask is comprised of a selected one of said clear stripe or opaque stripe designs;

(B) said camera includes a sensor having a line array of sensor elements to obtain a line image; and

which includes

(C) means for continuously moving said object through said inspection location to build up an image of said object.

8. Apparatus according to claim 7 which includes:

(A) encoder means coupled to said signal processor to provide said signal processor with positional information relative to said object, as said object moves through said inspection station.

9. Apparatus according to claim 7 wherein:

(A) said line array is a straight line.