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Method for producing a precision 3-D measuring apparatus

  • US 6,015,473 A
  • Filed: 11/01/1996
  • Issued: 01/18/2000
  • Est. Priority Date: 08/07/1995
  • Status: Expired due to Term
First Claim
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1. A method for assembling a linkage assembly of a probe apparatus for measuring three-dimensional coordinates and for calibrating the probe apparatus, the linkage assembly including a plurality of rotatable joint members and a linkage, the method comprising:

  • providing two joint fixtures positioned a precise distance apart and having a precise predetermined orientation with respect to each other, each of said fixtures for receiving and holding one of said rotatable joint members of said linkage assembly;

    loosely connecting a portion of each of said rotatable joint members to an associated end of a linkage so that said portions of said joint members can each be moved along said linkage to different positions at said end of said linkage;

    moving said loosely connected portion of said rotatable joint member along said linkage to one of said positions to provide a distance between said portions of said joint members that allows each of said joint members to fit in a respective joint fixture;

    placing and holding each of said joint members of said linkage assembly in an associated one of said joint fixtures such that said linkage has a precise desired length between said portions of said joint members;

    bonding said portions of said joint members to said linkage while said joint members are held in said joint fixtures, thereby providing joints at both ends of said linkage at a precise distance apart from each other;

    including said linkage assembly in said probe apparatus; and

    calibrating said probe apparatus which includes said joint linkage assembly and a probe, wherein said calibrating includes positioning said probe at an arbitrary location within a selected volume, sampling a plurality of orientations of said probe at said arbitrary location, and determining calibration parameters based on error values determined between said sampled orientations, wherein said calibration parameters are used when determining a position and orientation of said probe during use of the probe apparatus.

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