Ultra high-speed chip semiconductor integrated circuit interconnect structure and fabrication method using free-space dielectrics

• US 6,016,000 A
• Filed: 04/22/1998
• Issued: 01/18/2000
• Est. Priority Date: 04/22/1998
• Status: Expired due to Fees

• Current Assignee: CVC, Inc. (Sarnova HC LLC)
• Original Assignee: CVC, Inc. (Sarnova HC LLC)
• Inventors: Moslehi, Mehrdad M.
• Primary Examiner(s): Clark, Sheila V.
• Application Number:
  US09/064,431
• Time in Patent Office: 636 Days
• Field of Search: 257/522, 257/758, 257/759, 257/751
• US Class Current: 257/522
• CPC Class Codes: H01L 23/5222 Capacitive arrangements or effects of, or between wiring layers other capacitive arrangements H01L23/642
• CPC Class Codes: H01L 23/5329 Insulating materials
• CPC Class Codes: H01L 24/05 of an individual bonding area
• CPC Class Codes: H01L 2924/00 Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
• CPC Class Codes: H01L 2924/12042 LASER
• CPC Class Codes: H01L 2924/14 Integrated circuits

Abstract

Ultra high-speed multi-level interconnect structure and fabrication process flows are disclosed for a semiconductor integrated circuit chip. The interconnect structures of this invention include a plurality of electrically conductive metallization levels. Each of the metallization levels includes a plurality of electrically conductive interconnect lines. A plurality of electrically conductive plugs make electrical connections between various metallization levels as well as between the metallization levels and the semiconductor devices fabricated on the semiconductor substrate. The invention further includes a free-space medium occupying at least a substantial fraction of the electrically insulating regions within the multi-level interconnect structure surrounding the interconnect lines and plugs. A top passivation overlayer hermetically seals the multi-level interconnect structure. The top passivation overlayer used for hermetic sealing also functions as a heat transfer medium to facilitate heat removal from the interconnect metallization structure as well as to provide additional mechanical support for the multi-level interconnect structure through contact with the top metallization level of the multi-level interconnect structure. The hermetically sealed free-space medium minimizes the capacitive cross-talk noise in the interconnect structure, enabling increased chip operating speeds and reduced chip power distribution.

Claims

1. A multi-level interconnect structure for a semiconductor integrated circuit chip on a semiconductor substrate comprising:

a plurality of electrically conductive metallization levels, each of said metallization levels comprising a plurality of electrically conductive interconnect segments;

a plurality of electrically conductive plugs for electrically connecting between various metallization levels and between said metallization levels and a plurality of semiconductor devices;

a free-space medium occupying at least a substantial portion of the electrically insulating regions within said multi-level interconnect structure; and

an electrically insulating top passivation overlayer for hermetic sealing of said multi-level interconnect structure and for protection of said integrated circuit chip, said top passivation overlayer also serving as a heat transfer medium for facilitating heat removal from said interconnect structure and providing additional mechanical support for said interconnect structure through contact with the top metallization level of said multi-level interconnect structure.

2. The multi-level interconnect structure of claim 1 wherein said top passivation overlayer is formed to substantially maintain said free space medium.

3. The multi-level interconnect structure of claim 1 wherein at least a portion of said electrically conductive plugs is made of copper, and wherein at least a portion of said electrically conductive interconnect segments is made of copper.

4. The multi-level interconnect structure of claim 1 wherein at least a portion of said electrically conductive interconnect segments and plugs is made of a material comprising silver or aluminum.

5. The multi-level interconnect structure of claim 1 wherein at least a portion of said electrically conductive interconnect segments and plugs is made of a material comprising a superconducting material.

6. The multi-level interconnect structure of claim 1 wherein said semiconductor substrate is silicon, or silicon-on-insulator, or galium arsenide.

7. The multi-level interconnect structure of claim 1 wherein said electrically insulating top passivation overlayer is made of a material comprising silicon nitride, silicon oxynitride, aluminum nitride, diamond-like coating, boron nitride or silicon carbide.

8. The multi-level interconnect structure of claim 1 wherein said electrically insulating top passivation overlayer comprises a material layer with a plurality of open bonding pad windows and closed resealed windows, the latter used for formation of said free-space medium and subsequent hermetic sealing of said interconnect structure.

9. The multi-level interconnect structure of claim 1 wherein said multi-level interconnect structure is further supported by an electrically insulating bottom buffer layer, said electrically insulating bottom buffer layer separating said multi-level interconnect structure from underlying transistors and isolation regions fabricated within said semiconductor integrated circuit chip substrate.

10. The multi-level interconnect structure of claim 9 wherein said top passivation overlayer provides openings to expose the electrically conductive bonding pads and said electrically insulating bottom buffer layer provides openings for electrical connections between a portion of said electrically conductive plugs and said underlying transition within said semiconductor substrate.

11. The multi-level interconnect structure of claim 9 wherein said multi-level interconnect structure provides mechanical stability through a plurality of interconnections among said electrically conductive interconnect segments and plugs, binding connections between said top passivation overlayer and a portion of the top metallization level, as well as binding connections between a portion of said electrically conductive plugs and said electrically insulating bottom buffer layer.

12. The multi-level interconnect structure of claim 9 wherein said plurality of electrically conductive levels and plugs is embedded within a sealed cavity formed between said top passivation overlayer and said electrically bottom buffer layer in conjunction with a free-space dielectric medium.

13. The multi-level interconnect structure of claim 9, wherein said electrically insulating bottom buffer layer is made of a material comprising silicon nitride, aluminum nitride, diamond-like coating, silicon carbide, or boron nitride.

14. The multi-level interconnect structure of claim 9, wherein said electrically insulating bottom buffer layer provides additional mechanical support for said multi-level interconnect structure.

15. The multi-level interconnect structure of claim 14, wherein said electrically insulating bottom buffer layer further provides a blocking material with effective diffusion barrier properties against contamination of said semiconductor substrate by the metallization materials and ionic contaminants.

16. The multi-level interconnect structure of claim 14 wherein said electrically insulating bottom buffer layer enables formation of said free-space medium without damage to said underlying transitory and isolation regions.

17. The multi-level interconnect structure of claim 1, wherein said hermetically sealed free-space medium comprises a gaseous material.

18. The multi-level interconnect structure of claim 1, wherein said hermetically sealed free-space medium comprises vacuum.

19. The multi-level interconnect structure of claim 17, wherein said gaseous material is in the pressure range of less than 5 atmospheres.

20. The multi-level interconnect structure of claim 17, wherein said gaseous material is at or near the atmospheric pressure.

21. The multi-level interconnect structure of claim 17, wherein said gaseous material comprises a high-thermal-conductivity inert gas.

22. The multi-level interconnect structure of claim 21, wherein said inert gas comprises helium or argon.

23. The multi-level interconnect structure of claim 17, wherein said gaseous material comprises nitrogen or hydrogen.

24. The multi-level interconnect structure of claim 17, wherein said gaseous material suppresses electrical leakage currents and gas breakdown within said free-space medium due to said electrically conductive interconnect segments and plugs.

25. The multi-level interconnect structure of claim 19 wherein the exposed surfaces of said plurality of electrically conductive interconnect segments and plugs further comprise an encapsulation coating layer.

26. The multi-level interconnect structure of claim 11, wherein said encapsulation coating layer comprises an electrically conductive material (such as TiN_x, TaN_x, Wn_x, or silver).

27. The multi-level interconnect structure of claim 25, wherein said encapsulation coating layer comprises an electrically insulating material (such as silicon dioxide, silicon nitride, aluminum nitride, aluminum oxide, or diamond-like carbon).

28. The multi-level interconnect structure of claim 27, wherein said electrically insulating encapsulation coating layer suppresses electrical leakage and breakdown within said interconnect structure.

29. The multi-level interconnect structure of claim 1 wherein at least a portion of said plurality of electrically conductive interconnect segments and plugs comprises a high electrical conductivity material (such as copper, silver, gold, or a superconducting material).

30. The multi-level interconnect structure of claim 1, wherein a portion of said electrically conductive plugs comprises the conductive contact plugs which provide electrical connection between the first metallization level and underlying semiconductor devices and are encapsulated in a conductive diffusion barrier layer (such as TiN_x, TaN_x, Wn_x, Ta, or a ternary conductive barrier material).

31. The multi-level interconnect structure of claim 30, wherein the plurality of metallization levels between the second level and the top level as well as the plurality of electrically conductive via plugs providing interlevel connections above first metallization level do not utilize any electrically conductive diffusion barrier layers.

32. The multi-level interconnect structure of claim 9, wherein said top passivation overlayer and said bottom electrically insulating buffer layer are formed using at least one etch-resistant electrically insulating material (such as one or a combination of silicon nitride, aluminum nitride, silicon carbide, boron nitride, or diamond-like coating).

33. The multi-level interconnect structure of claim 9, wherein said top passivation overlayer and said bottom electrically insulating buffer layer join together to make a sealed contact at the peripheral region of said semiconductor integrated circuit chip to form a hermetically-sealed and mechanically stable cavity encapsulating said plurality of electrically conducting metallization levels, said plurality of electrically conductive plugs, and said free-space medium.

34. The multi-level interconnect structure of claim 1, wherein at least a substantial portion of contact interfaces among said electrically conductive metallization levels and electrically conductive plugs comprise direct connections of identical metallization materials without any interfacial contact barrier layers.

35. The multi-level interconnect structure of claim 1, wherein a plurality of dummy plugs connected to bottom surface of the top passivation overlayer provides additional structural and mechanical support for said multi-level interconnect structure.