Inductively coupled plasma reactor with an inductive coil antenna having independent loops
First Claim
1. An inductively coupled plasma reactor for processing a substrate in a reactor chamber containing a process gas, comprising:
- an inductively coupled coil antenna, said coil antenna comprising plural inductive antenna loops adjacent different portions of said chamber and which are electrically separate from one another;
plural RF impedance match networks each connected to respective ones of the antenna loops;
plural RF power level adjusting circuits each connected to a respective one of the RF match networks and being capable of changing and setting an RF power level;
an RF power distribution controller connected to each of the RF power level adjusting circuits, said controller being capable of simultaneously controlling each of the RF power level adjusting circuits to individually govern the RF power levels to provide a uniform plasma ion density distribution across the top surface of the substrate.
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Accused Products
Abstract
An inductively coupled plasma reactor for processing a substrate has an inductively coupled coil antenna including plural inductive antenna loops which are electrically separated from one another and independently connected to separately controllable plasma source RF power supplies. The RF power level in each independent antenna loop is separately programmed and instantly changeable to provide a perfectly uniform plasma ion density distribution across the entire substrate surface under a large range of plasma processing conditions, such as different process gases or gas mixtures. In a preferred embodiment, there are as many separately controllable RF power supplies as there are independent antenna loops, and all the separately controllable power supplies receive their RF power from a commonly shared RF generator.
126 Citations
63 Claims
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1. An inductively coupled plasma reactor for processing a substrate in a reactor chamber containing a process gas, comprising:
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an inductively coupled coil antenna, said coil antenna comprising plural inductive antenna loops adjacent different portions of said chamber and which are electrically separate from one another; plural RF impedance match networks each connected to respective ones of the antenna loops; plural RF power level adjusting circuits each connected to a respective one of the RF match networks and being capable of changing and setting an RF power level; an RF power distribution controller connected to each of the RF power level adjusting circuits, said controller being capable of simultaneously controlling each of the RF power level adjusting circuits to individually govern the RF power levels to provide a uniform plasma ion density distribution across the top surface of the substrate. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A plasma reactor for processing a substrate in a reactor chamber containing a process gas, comprising:
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a coil antenna including plural antenna loops adjacent respective different portions of said chamber, said loops being in parallel with each other electrically, and adapted to establish a plasma within said chamber primarily by inductive coupling; plural RF impedance match networks each connected to respective ones of the antenna loops; a plurality of RF power level adjustors connected to respective ones of the RF impedance match network, said RF power level adjustors connected in series with said antenna loops, each of said RF power level adjustors also adapted to be connected to a source of RF power and being independently controllable with respect to the remaining RF power level adjustors to provide a desired plasma characteristic; an RF power distribution controller wherein each of said RF power level adjustors responds to an adjustment signal from said controller to adjust the power to each antenna loop to achieve a predetermined desired plasma characteristic. - View Dependent Claims (14, 15, 16, 17, 18, 19)
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20. A method for processing a substrate in a reactor chamber containing a process gas, comprising:
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coupling RF power into said chamber using an RF radiator comprising plural conductive elements which are electrically separated from one another and distributed at respective locations adjacent said chamber, each of said plural conductive elements connected to a respective one of a plural RF impedance match network, said coupling of RF power by employing plural RF power level adjusting circuits, each of the adjusting circuits being connected to a respective one of the RF impedance match networks and connected to receive respective RF power signals, respective RF power signals being provided by an RF power generator, each of the RF power level adjusting circuits further being capable of changing and setting an RF power level of the RF power signal; and simultaneously controlling each of the RF power level adjusting circuits to individually govern the RF power level of each of the RF power signals so as to control the plasma ion density distribution across the top surface of the substrate by employing an RF power distribution controller connected to each of the RF power level adjusting circuits. - View Dependent Claims (21, 22)
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23. A plasma reactor for processing a substrate, comprising:
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an RF radiator capable of coupling power into a processing chamber, said radiator comprising plural conductive elements adjacent different portions of the chamber which are electrically separate from one another; plural RF impedance match networks each connected to respective ones of the plural conductive elements; plural RF power level adjusting circuits each connected to a respective one of the RF impedance match networks and connected to receive respective RF power signals, each of the RF power level adjusting circuits being capable of changing and setting an RF power level of the RF power signal; an RF power distribution controller connected to each of the RF power level adjusting circuits, said controller being capable of simultaneously controlling each of the RF power level adjusting circuits to individually govern the RF power level of each of the RF power signals to provide a uniform plasma ion density distribution across the top surface of the substrate. - View Dependent Claims (24)
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25. An inductively coupled plasma reactor for processing a substrate, comprising:
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a wafer pedestal; an inductively coupled coil antenna, said coil antenna comprising plural inductive antenna loops adjacent different portions of said chamber and which are electrically separate from one another; said plural inductive antenna loops comprising respective conductors wound around respective loop axes, all of said respective loop axes being coincident with an axis of symmetry of said wafer pedestal; plural RF impedance match networks each connected to respective ones of the antenna loops; plural RF power level adjusting circuits each connected to a respective one of the RF impedance match networks and connected to receive respective RF power signals, each of the RF power level adjusting circuits being capable of changing and setting an RF power level of the RF power signal; and an RF power distribution controller connected to each of the RF power level adjusting circuits, said controller being capable of simultaneously controlling each of the RF power level adjusting circuits to individually govern the RF power level of each of the RF power signals to provide a uniform plasma ion density distribution across the top surface of the substrate. - View Dependent Claims (26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37)
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38. A plasma reactor for processing a workpiece, comprising:
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a processing chamber; a workpiece support disposed within said processing chamber; a dome-shaped ceiling overlying said workpiece support; an RF radiator comprising plural conductive elements that are electrically separate from each other, said plural conductive elements adjacent different portions of said processing chamber; an RF power distribution controller connected to respective ones of said plural conductive elements, said RF power distribution controller capable of simultaneously controlling an RF power level to each one of said plural conductive elements so as to provide a uniform plasma ion density distribution across the workpiece. - View Dependent Claims (39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50)
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51. A method of processing a workpiece, comprising:
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coupling RF power into a processing chamber, said processing chamber having a workpiece support therein and a dome-shaped ceiling overlying said workpiece support, using an RF radiator comprising plural conductive elements that are electrically separate from each other and distributed at different locations adjacent said processing chamber, each of said plural conductive elements connected to an RF power distribution controller; and simultaneously controlling an RF power level to each one of said plural conductive elements using said RF power distribution controller so as to control the plasma ion density distribution across the top surface of the workpiece. - View Dependent Claims (52, 53, 54, 55, 56, 57, 58, 59, 60, 61, 62, 63)
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Specification