Electrical contact probe

• US 6,020,747 A
• Filed: 01/26/1998
• Issued: 02/01/2000
• Est. Priority Date: 01/26/1998
• Status: Expired due to Fees

• Current Assignee: John Burns Trust, Co., Probot, Inc. (Mania Technologie AG)
• Original Assignee: Probot, Inc. (Mania Technologie AG)
• Inventors: Bahns, John T., Dabora, Eli K.
• Primary Examiner(s): Ballato, Josie
• Assistant Examiner(s): SUNDARAM, T R
• Application Number:
  US09/013,083
• Time in Patent Office: 736 Days
• Field of Search: 324/754, 324/761, 324/158.1, 324/762, 324/757, 324/758, 204/400, 204/403
• US Class Current: 324/754.14
• CPC Class Codes: G01R 1/06738 related to tip portion
• CPC Class Codes: G01R 1/06755 Material aspects
• CPC Class Codes: Y10S 977/876 Nanotube tip

Abstract

The present invention is directed to an electrical contact probe, comprising at least one fiber mounted in a holder, the at least one fiber having high electrical conductivity and high mechanical strength and made from a material selected from the group consisting of a conductive organic material and a conductive glass, the at least one fiber having a diameter in the range from 5 nanometers to 20 micrometers. The present invention is also directed to a device to measure various electrical parameters of a circuit.

Claims

1. An electrical contact probe, comprising at least one fiber mounted in a holder, said at least one fiber having low electrical resistance and high mechanical strength and made from a material selected from the group consisting of a conductive organic material and a conductive glass, said at least one fiber having a diameter in the range from about 5 nanometers to about 20 micrometers.

2. The electrical contact probe of claim 1, wherein said conductive organic material is selected from the group consisting of carbon nanotubes, carbon fibers, metal-coated carbon fibers, and conductive polymers.

3. The electrical contact probe of claim 2, wherein the diameter of said fiber is in the range of from about 6 nanometers to about 10 micrometers.

4. The electrical contact probe of claim 3, wherein the diameter of said fiber is in the range of from about 8 nanometers to about 8 micrometers.

5. The electrical contact probe of claim 2, wherein said electrical resistivity is in the range of from about 10^-3 to about 10⁵ Ohm.meters.

6. The electrical contact probe of claim 2, wherein said mechanical strength of said fiber comprises tensile strength in the range of from about 3×

10⁴ to about 1.3×

10⁸ PSI, and a modulus of elasticity in the range of from about 3×

10⁴ to about 10⁸ PSI.

7. The electrical contact probe of claim 2, wherein said at least one fiber is a linear bundle of fibers.

8. The electrical contact probe of claim 1, wherein said holder comprises a housing and a conductive packing material contained in said housing, said conductive packing material in electrical communication with said at least one fiber.

9. The electrical contact probe of claim 8, wherein said conductive packing material is selected from the group consisting of graphite, copper, aluminum, silver paste, and combinations thereof.

10. The electrical contact probe of claim 2, further comprising a spring positioned between said fiber and said holder.

11. An electrical circuit test device, comprising:

a contact probe comprising at least one fiber mounted in a holder, said at least one fiber having low electrical resistance and high mechanical strength and made from a material selected from the group consisting of a conductive organic material and a conductive glass, said fiber having a diameter in the range from about 5 nanometers to about 20 micrometers;

a current source in electrical communication with said contact probe; and

a measuring device in electrical communication with said contact probe.

12. The electrical circuit test device of claim 11, wherein said conductive organic material is selected from the group consisting of carbon nanotubes, carbon fibers, metal-coated carbon fibers, and conductive polymers.

13. The electrical circuit test device of claim 12, wherein the diameter of said fiber is in the range of from about 6 nanometers to about 10 micrometers.

14. The electrical circuit test device of claim 13, wherein the diameter of said fiber is in the range of from about 8 nanometers to about 8 micrometers.

15. The electrical circuit test device of claim 12, wherein said electrical resistivity is in the range of from about 10^-3 to about 10⁵ Ohm.meters.

16. The electrical circuit test device of claim 12, wherein said mechanical strength of said fiber comprises tensile strength in the range of from about 3×

10⁴ to about 1.3×

10⁸ PSI, and a modulus of elasticity in the range of from about 3×

10⁴ to about 10⁸ PSI.

17. The electrical circuit test device of claim 12, wherein said at least one fiber is a linear bundle of fibers.

18. The electrical circuit test device of claim 12, wherein said holder comprises a housing and a conductive packing material contained in said housing, said conductive packing material in electrical communication with said at least one fiber.

19. The electrical circuit test device of claim 18, wherein said conductive packing material is selected from the group consisting of graphite, copper, aluminum, silver paste, and combinations thereof.

20. The electrical circuit test device of claim 12, wherein said electrical circuit test device is selected from the group consisting of a bed of nails test device and a flying probe test device.

21. The electrical circuit test device of claim 12, wherein said contact probe further comprises a spring positioned between said fiber and said holder.

22. An electrical circuit test device, comprising:

a first contact probe comprising at least one first fiber mounted in a first holder, said at least one first fiber having low electrical resistivity and high mechanical strength and made from a material selected from the group consisting of a conductive organic material and a conductive glass, said fiber having a diameter in the range from about 5 nanometers to about 20 micrometers;

a second contact probe comprising at least one second fiber mounted in a second holder, said at least one second fiber having low electrical resistivity and high mechanical strength and made from a material selected from the group consisting of a conductive organic material and a conductive glass, said fiber having a diameter in the range from about 5 nanometers to about 20 micrometers;

a current source in electrical communication with said first contact probe and said second contact probe; and

a measuring device in electrical communication with said current source.

23. The electrical circuit test device of claim 22, wherein said conductive organic material is selected from the group consisting of carbon nanotubes, carbon fibers, metal-coated carbon fibers, and conductive polymers.

24. The electrical circuit test device of claim 23, wherein the diameter of said first fiber or said second fiber is in the range of from about 6 nanometers to about 10 micrometers.

25. The electrical circuit test device of claim 24, wherein the diameter of said first fiber or said second fiber is in the range of from about 8 nanometers to about 8 micrometers.

26. The electrical circuit test device of claim 23, wherein said electrical resistivity is in the range of from about 10^-3 to about 10⁵ Ohm.meters.

27. The electrical circuit test device of claim 23, wherein said mechanical strength of said fiber comprises tensile strength in the range of from about 3×

10⁴ to about 1.3×

10⁸ PSI, and a modulus of elasticity in the range of from about 3×

10⁴ to about 10⁸ PSI.

28. The electrical circuit test device of claim 23, wherein said at least one fiber is a linear bundle of fibers.

29. The electrical circuit test device of claim 22, wherein said first holder and said second holder comprise a housing and a conductive packing material contained in said housing, said conductive packing material in electrical communication with said at least one first fiber and said at least one second fiber, respectively.

30. The electrical circuit test device of claim 29, wherein said conductive packing material is selected from the group consisting of graphite, copper, aluminum, silver paste, and combinations thereof.

31. The electrical circuit test device of claim 22, wherein said electrical circuit test device is selected from the group consisting of a bed of nails test device and a flying probe test device.

32. The electrical circuit test device of claim 23, wherein said first contact probe further comprises a first spring positioned between said first fiber and said first holder, and wherein said second contact probe further comprises a second spring positioned between said second fiber and said second holder.