Low current redundancy anti-fuse method and apparatus

• US 6,023,431 A
• Filed: 10/03/1996
• Issued: 02/08/2000
• Est. Priority Date: 10/03/1996
• Status: Expired due to Term

• Current Assignee: Micron Technology, Inc.
• Original Assignee: Micron Technology, Inc.
• Inventors: Ho, Fan, Beigel, Kurt D., Cutter, Douglas J.
• Primary Examiner(s): ZARABIAN, AMIR
• Application Number:
  US08/724,851
• Time in Patent Office: 1,223 Days
• Field of Search: 365/200, 365/96, 365/225.7, 327/525, 327/526, 326/38, 326/10
• US Class Current: 365/200
• CPC Class Codes: G11C 17/18 Auxiliary circuits, e.g. for writing into memory
• CPC Class Codes: G11C 29/785 with redundancy programming schemes
• CPC Class Codes: G11C 29/83 with reduced power consumption

Abstract

A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.

Claims

1. An integrated circuit comprising:

an enabling type programmable circuit providing an enable signal having a programmed state and unprogrammed state; and

at least one second type programmable circuit providing a programmed signal having a first state and a second state and prevented from being in a selected one of the first or second states in response to the enable signal being in the unprogrammed state, the at least one programmable circuit including a first anti-fuse and a second anti-fuse, wherein the programmed signal is in the first state in response to the enable signal being in the programmed state and the first anti-fuse being programmed and the programmed signal is in the second state in response to the enable signal being in the programmed state and the second anti-fuse being programmed, further wherein the first anti-fuse is programmed when the second anti-fuse is unprogrammed and the first anti-fuse is unprogrammed when the second anti-fuse is programmed.

2. The integrated circuit of claim 1 wherein the integrated circuit is a memory integrated circuit.

3. The integrated circuit of claim 2 wherein the memory integrated circuit is a dynamic random access memory (DRAM).

4. The integrated circuit of claim 2 further comprising:

primary circuit elements; and

a redundant circuit element, wherein a selected one of the primary circuit elements is replaceable by the redundant circuit element based on the state of each of the programmed signals from the at least one second type programmable circuit.

5. The integrated circuit of claim 4 wherein the integrated circuit is a memory integrated circuit comprising an array of memory cells arranged in rows and columns, and wherein the primary circuit elements comprise rows of memory cells.

6. The integrated circuit of claim 4 wherein the integrated circuit is a memory integrated circuit comprising an array of memory cells arranged in rows and columns, and wherein the primary circuit elements comprise columns of memory cells.

7. The integrated circuit of claim 4 wherein the integrated circuit is a memory integrated circuit comprising an array of memory cells arranged in rows and columns, and wherein the primary circuit elements comprise rows and columns of memory cells.

8. The integrated circuit of claim 1 wherein the integrated circuit includes a fuse identification based on the state of each of the programmed signals from the at least one second type programmable circuit.

9. The integrated circuit of claim 1 wherein the state of each of the programmed signals from the at least one second type programmable circuit is employed to select between at least two modes of operation of the integrated circuit.

10. A method of programming an integrated circuit comprising the steps of:

providing an enable signal having a programmed state and unprogrammed state;

programming a selected one of a first anti-fuse or a second anti-fuse; and

providing a programmed signal having a first state and a second state, wherein the programmed signal is prevented from being in a selected one of the first or second states in response to the enable signal being in the unprogrammed state, the programmed signal is in the first state in response to the enable signal being in the programmed state and the first anti-fuse being programmed, and the programmed signal is in the second state in response to the enable signal being in the programmed state and the second anti-fuse being programmed.

11. The method of claim 10 wherein the integrated circuit is a memory integrated circuit.

12. The method of claim 10 wherein the integrated circuit includes primary circuit elements and a redundant circuit element, and the method further comprises the step of replacing a selected one of the primary circuit elements with the redundant circuit element based on the state of the programmed signal.

13. The method of claim 12 wherein the integrated circuit is a memory integrated circuit comprising an array of memory cells arranged in rows and columns, and wherein the primary circuit elements comprise rows of memory cells.

14. The method of claim 12 wherein the integrated circuit is a memory integrated circuit comprising an array of memory cells arranged in rows and columns, and wherein the primary circuit elements comprise columns of memory cells.

15. The method of claim 12 wherein the integrated circuit is a memory integrated circuit comprising an array of memory cells arranged in rows and columns, and wherein the primary circuit elements comprise rows and columns of memory cells.

16. The method of claim 10 further comprising the step of generating a fuse identification based on the state of each of the programmed signals from the at least one second type programmable circuit.

17. The method of claim 10 further comprising the step of selecting between at least two modes of operation of the integrated circuit based on the state of each of the programmed signals from the at least one second type programmable circuit.