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Method and apparatus for generation of test bitstreams and testing of closed loop transducers

  • US 6,023,960 A
  • Filed: 04/28/1999
  • Issued: 02/15/2000
  • Est. Priority Date: 12/17/1997
  • Status: Expired due to Term
First Claim
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1. A method for generating a test bitstream for testing a closed loop transducer which includes a sensor and an Analog-to-Digital converter (ADC) having a Σ

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    bitstream which is fed back to said sensor, comprising the steps ofgenerating a pattern bitstream andrepeating said test pattern bitstream to form said test bitstream.

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