Method of reducing agglomerate particles in a polishing slurry
First Claim
1. A method for reducing agglomerate particles in a polishing slurry having a design particle size that is to be dispensed by a slurry dispensing system, comprising:
- transferring said polishing slurry by said slurry dispensing system from a slurry source to an energy source coupled to said slurry dispensing system, said slurry forming an agglomerate within said slurry dispensing system, said agglomerate having an agglomerated particle size substantially larger than said design particle size;
subjecting said agglomerate to energy emanating from said energy source; and
transferring energy from said energy source to said agglomerate to reduce said agglomerated particle size to substantially said design particle size.
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Accused Products
Abstract
The present invention, in one embodiment, provides a method for eliminating agglomerate particles in a polishing slurry. In this particular embodiment, the method includes transferring a slurry that has a design particle size from a slurry source to an energy source. In many instances, the slurry forms an agglomerate that has an agglomerated particle size, which is substantially larger than the design particle size. This larger particle size is highly undesirable because it can damage the semiconductor wafer surface as it is polished. The method further includes subjecting the agglomerate to energy, such as an ultra sonic wave emanating from the energy source, and transferring energy from the energy source to the slurry to reduce the agglomerated particle size to substantially the design particle size.
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Citations
26 Claims
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1. A method for reducing agglomerate particles in a polishing slurry having a design particle size that is to be dispensed by a slurry dispensing system, comprising:
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transferring said polishing slurry by said slurry dispensing system from a slurry source to an energy source coupled to said slurry dispensing system, said slurry forming an agglomerate within said slurry dispensing system, said agglomerate having an agglomerated particle size substantially larger than said design particle size; subjecting said agglomerate to energy emanating from said energy source; and transferring energy from said energy source to said agglomerate to reduce said agglomerated particle size to substantially said design particle size. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A system for reducing agglomerate particles in a polishing slurry having a design particle size that is to be dispensed, comprising:
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a chemical/mechanical polishing apparatus having a polishing surface associated therewith; a slurry source containing said polishing slurry; a slurry dispensing system having a slurry dispensing end and configured to transfer said polishing slurry from said slurry source to said polishing surface positioned near said slurry dispensing end, said polishing slurry forming an agglomerate within said slurry dispensing system, said agglomerate having an agglomerated particle size substantially larger than said design particle size; and an energy source coupled to said dispensing end and configured to transfer energy to said agglomerate to reduce said agglomerated particle size to substantially said design particle size. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20)
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21. A method for polishing a semiconductor wafer, comprising:
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positioning a surface of said semiconductor wafer against a polishing surface; transferring a slurry having a design particle size from a slurry source of a slurry dispensing system to an energy source coupled to said slurry dispensing system, said slurry forming an agglomerate within said slurry dispensing system, said agglomerate having an agglomerated particle size substantially larger than said design particle size; subjecting said agglomerate to energy emanating from said energy source; transferring energy from said energy source to said agglomerate to reduce said agglomerated particle size to substantially said design particle size; transferring said slurry to said polishing surface subsequent to a reduction in said agglomerated particle size; and polishing said surface of said semiconductor wafer. - View Dependent Claims (22, 23, 24, 25)
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26. A method for polishing a semiconductor wafer, comprising:
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positioning a surface of said semiconductor wafer against a polishing surface; transferring a slurry having a design particle size from a slurry source to a predispensing location prior to being dispensed on said polishing surface, said slurry forming an agglomerate; subjecting said slurry to energy emanating from an energy source prior to dispensing said slurry on said polishing surface to reduce said agglomerated particle size; and transferring said slurry to said polishing surface and polishing said surface of said semiconductor wafer.
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Specification