High temperature test fixture

• US 6,027,354 A
• Filed: 10/02/1998
• Issued: 02/22/2000
• Est. Priority Date: 10/02/1998
• Status: Expired due to Fees

• Current Assignee: Micro Instruments Company
• Original Assignee: Micro Instruments Company
• Inventors: Leigh, B. Lyle, Bowers, Kenneth D.
• Primary Examiner(s): Stephan, Steven L.
• Assistant Examiner(s): DUVERNE, JEAN F
• Application Number:
  US09/165,527
• Time in Patent Office: 508 Days
• Field of Search: 439/70, 439/225, 439/682, 439/684, 439/683, 324/760
• US Class Current: 439/225
• CPC Class Codes: G01R 1/0458 related to environmental aspects, e.g. temperature

Abstract

An apparatus for connecting an electronic device located in a high temperature environment, with a test unit located in a lower temperature environment, includes a ceramic fixturing plate that is formed with at least one hole. The apparatus also includes a metal spring conductor clip which has a first end and a second end. The first end of the conductor clip is selectively insertable into a hole of the fixturing plate to establish electrical contact with a lead from the electronic device being tested. At the same time, the second end of the conductor clip is engageable with the fixturing plate to hold the conductor clip on the plate. A wire, which is mechanically and electrically connected to the conductor clip, electrically connects the electronic device with the test unit that is located in the lower temperature environment.

Claims

1. An apparatus for connecting an electronic device with a test unit, said device having a lead extending therefrom and said apparatus comprising:

a fixturing plate formed with at least one hole for receiving said lead therein;

a spring clip having a first end and a second end, said first end being selectively inserted into said hole of said fixturing plate to establish electrical contact with said lead, said second end being engageable with said fixturing plate to hold said spring thereon; and

a wire connected to said spring clip to electrically connect said spring clip with said test unit.

2. An apparatus as recited in claim 1 further comprising a retainer plate, said retainer plate being securely attached to said fixturing plate to hold said spring clip on said fixturing plate.

3. An apparatus as recited in claim 2 wherein said fixturing plate and said retainer plate are made of a ceramic material and said ceramic material is alumina.

4. An apparatus as recited in claim 1 wherein said spring clip is made of metal.

5. An apparatus as recited in claim 1 wherein said spring clip comprises:

a base member;

a first arm connected with said base member to extend substantially perpendicular therefrom, said first end being integral with said first arm and distanced thereon from said base member; and

a second arm connected with said base member to extend substantially perpendicular therefrom, said second arm being substantially parallel to said first arm to define a gap therebetween, said second end being integral with said second arm and distanced thereon from said base member.

6. An apparatus as recited in claim 5 wherein said first end is a flex arm extending at an angle from said first arm into said gap between said first arm and said second arm.

7. An apparatus as recited in claim 6 wherein said flex arm is formed with an electrical contact point for establishing electrical contact with said lead of said electronic device.

8. An apparatus as recited in claim 5 wherein said second end is a retainer arm, said retainer arm being substantially perpendicular to said second arm and extending therefrom into said gap between said second arm and said first arm.

9. An apparatus as recited in claim 1 wherein said first end of said first arm and said second end of said second arm are inserted into a same said hole in said fixturing plate.

10. An apparatus as recited in claim 1 wherein said fixturing plate is formed with a plurality of said holes, said plurality of holes including a first hole and a second hole, and wherein said first end of said first arm is inserted into said first hole and said second end of said second arm is inserted into said second hole.

11. An apparatus as recited in claim 1 wherein said apparatus is electrically connected to said electronic device in an environment having a temperature above approximately two hundred and fifty degrees Celsius (250°

C.), and said apparatus is electrically connected to said test unit in an environment having a temperature substantially below two hundred and fifty degrees Celsius (250°

C.).

12. An apparatus for connecting an electronic device with a test unit, said device having a lead extending therefrom and said apparatus comprising:

a dielectric means for supporting said electronic device thereon with said lead exposed in a first environment having a temperature above approximately two hundred and fifty degrees Celsius (250°

C.) wherein said dielectric means is a ceramic fixturing plate formed with a plurality of holes, at least one said hole receiving said lead therein; and

a conductor means selectively engaged with said dielectric means, said conductor means being in electrical contact with said lead and with said test unit, said test unit being in a second environment having a temperature below approximately two hundred degrees Celsius (200°

C.) wherein said conductor means is a spring clip having a first end and a second end, said first end being selectively inserted into one said hole to establish electrical contact with said lead, said second end being engageable with said fixturing plate to hold said conductor means on said dielectric means.

13. An apparatus as recited in claim 12 wherein said spring clip comprises:

a base member;

a first arm connected with said base member to extend substantially perpendicular therefrom, said first end being integral with said first arm and distanced thereon from said base member; and

a second arm connected with said base member to extend substantially perpendicular therefrom, said second arm being substantially parallel to said first arm to define a gap therebetween, said second end being integral with said second arm and distanced thereon from said base member.

14. An apparatus as recited in claim 13 wherein said first end is a flex arm extending at an angle from said first arm into said gap between said first arm and said second arm, and wherein said flex arm is formed with an electrical contact point for establishing electrical contact with said lead of said electronic device, and further wherein said second end is a retainer arm, said retainer arm being substantially perpendicular to said second arm and extending therefrom into said gap between said second arm and said first arm.

15. An apparatus as recited in claim 14 wherein said first end of said first arm and said second end of said second arm are inserted into a same said hole in said fixturing plate.

16. An apparatus as recited in claim 14 wherein said fixturing plate is formed with a plurality of said holes, said plurality of holes including a first hole and a second hole, and wherein said first end of said first arm is inserted into said first hole and said second end of said second arm is inserted into said second hole.