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Dual cantilever scanning probe microscope

  • US 6,028,305 A
  • Filed: 03/25/1998
  • Issued: 02/22/2000
  • Est. Priority Date: 03/25/1998
  • Status: Expired due to Fees
First Claim
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1. A scanning probe microscope comprising:

  • a first probe configured to interact with and measure characteristics of surfaces within an effective measurement distance of said first probe;

    a first mechanism configured to position said first probe over a first point of a surface of a sample within said effective measurement distance;

    a second probe;

    a second mechanism configured to contact and remove said second probe to and from said surface of said sample at a second point, wherein said second point is separated from said first point by a predetermined distance in a predetermined direction; and

    a third mechanism configured to move said second probe said predetermined distance in said predetermined direction.

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