Calibrating test equipment

• US 6,032,107 A
• Filed: 05/19/1998
• Issued: 02/29/2000
• Est. Priority Date: 05/19/1998
• Status: Expired due to Term

• Current Assignee: Micron Technology, Inc.
• Original Assignee: Micron Technology, Inc.
• Inventors: Hitchcock, Edward Ryer
• Primary Examiner(s): Hoff, Marc S.
• Assistant Examiner(s): Bui, Bryan
• Application Number:
  US09/081,353
• Time in Patent Office: 651 Days
• Field of Search: 702/85, 702/117-121, 324/73.1, 324/74, 714/715, 714/718, 714/735, 714/738, 714/742
• US Class Current: 702/85
• CPC Class Codes: G01R 31/3191 Calibration

Abstract

A method and apparatus are used to calibrate uncelebrated test equipment using reference devices. For each device, the calibrated test equipment is used to test the device to obtain a reference specification value. One of the devices is then selected, and an electrical identification from the selected device is retrieved. The electrical identification is associated with one of the reference specification values. A channel of the uncelebrated test equipment is used to test the selected device to obtain a measured specification value. The reference specification value associated with the electrical identification is compared with the measured specification value. Based on this comparison, the channel is calibrated.

Claims

1. A method for calibrating uncalibrated test equipment using multiple pin reference devices, comprising:

using calibrated test equipment to test each multiple pin reference device to obtain a reference specification value;

selecting one of the multiple pin reference devices;

retrieving an electrical identification from the selected multiple pin reference device, the electrical identification associated with one of the reference specification values;

using a channel of the uncalibrated test equipment to test the selected multiple pin reference device to obtain a measured specification value;

comparing the reference specification value associated with the electrical identification with the measured specification value; and

based on the comparison, calibrating the channel.

2. The method of claim 1, wherein the act of comparing includes calculating a difference between the measured and reference specification values.

3. The method of claim 1, wherein the act of retrieving includes using the uncalibrated test equipment.

4. The method of claim 1, wherein the act of calibrating includes:

determining a difference between the reference and measured specification values; and

adding the difference to a calibration value used to calibrate the channel.

5. The method of claim 1, wherein the electrical identification comprises an identity formed by fuses.

6. A method for calibrating channels of test equipment using multiple pin reference devices, each multiple pin reference device including a readable electrical identification, comprising:

reading the electrical identifications from the multiple pin reference devices;

using the electrical identifications to automatically retrieve reference specification values for the multiple pin reference devices;

testing the multiple pin reference devices using the channels of the test equipment; and

based on results of the testing and the reference specification values, calibrating the channels.

7. The method of claim 6, wherein the act of calibrating the channel includes comparing the results of the testing with the reference specification values.

8. The method of claim 6, wherein the act of calibrating the channels includes adjusting a delay of one of the channels.

9. The method of claim 6, wherein the act of calibrating the channels includes adjusting a skew of one of the channels.

10. A method for calibrating a channel of test equipment using multiple pin devices having electrical identifications, some of the multiple pin devices being reference devices, comprising:

retrieving the electrical identifications from the multiple pin devices to identify the reference devices;

testing the multiple pin devices with the channel of the test equipment; and

for the reference devices, using the results of the testing and data associated with the reference devices to calibrate the channel.

11. The method of claim 10, wherein the retrieving includes using the test equipment.

12. A system for use with multiple pin reference devices, each different device having a different electrical identification, comprising:

a database storing reference specification values, each reference specification value being associated with a different one of the multiple pin reference devices and being obtained by a test by calibrated test equipment; and

uncalibrated test equipment adapted to;

select one of the multiple pin reference devices,

retrieve the electrical identification from the multiple pin reference device and use the identification to retrieve the reference specification value associated with the selected multiple pin reference device,

use a channel of the uncalibrated test equipment to test the selected multiple pin reference device to obtain a measured specification value,

compare the measured specification value with the reference specification value associated with the selected multiple pin reference device, and

based on the comparison, calibrate the channel.

13. The system of claim 12, wherein the uncalibrated test equipment is configured to compare by calculating a difference between the measured and reference specification values.

14. The system of claim 12, wherein the calibration by the uncalibrated test equipment includes:

determining a difference between the reference and measured specification values; and

adding the difference to a calibration value used to calibrate the channel.

15. A system for use with multiple pin reference devices, each multiple pin reference device having an electrical identification, comprising:

a database storing reference specification values, each different reference specification value associated with a different one of the electrical identifications; and

test equipment configured to;

retrieve the electrical identifications from the multiple pin reference devices,

based on the electrical identifications, retrieve the associated reference specification values,

test the multiple pin reference devices with a channel of the test equipment to obtain measured specification values, and

based on results of the test, calibrate the channel.

16. The system of claim 15, wherein the test equipment is configured to calibrate the channel by comparing the measured specification values with the reference specification values that are associated with the electrical identifications.

17. The system of claim 15, wherein the calibration by the test equipment includes:

determining a difference between the reference and measured specification values; and

adding the difference to a calibration value used to calibrate the channel.

18. A system for use with multiple pin electronic devices having electrical identifications, some of the multiple pin electronic devices being reference devices, comprising:

a database storing data associated with the reference devices; and

test equipment configured to;

retrieve the electrical identifications from the multiple pin electronic devices to identify the reference devices,

test the multiple pin electronic devices with a channel of the test equipment to obtain test values that correspond to the data stored in the database, and

for the reference devices, use the test values and the data to calibrate the channel.