Ultra high speed, low power, flash A/D converter utilizing a current mode regenerative comparator

• US 6,037,890 A
• Filed: 09/30/1997
• Issued: 03/14/2000
• Est. Priority Date: 09/30/1997
• Status: Expired due to Term

• Current Assignee: Intel Corporation
• Original Assignee: Intel Corporation
• Inventors: McDaniel, Bart R., Glass, Kevin W., Khalil, Waleed
• Primary Examiner(s): Tokar, Michael
• Assistant Examiner(s): WAMSLEY, PATRICK G
• Application Number:
  US08/940,159
• Time in Patent Office: 896 Days
• Field of Search: 341/156, 341/159, 341/162, 341/110, 341/139, 341/200, 341/158, 341/155
• US Class Current: 341/159
• CPC Class Codes: G11C 2207/063 Current sense amplifiers
• CPC Class Codes: G11C 7/062 Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs
• CPC Class Codes: H03K 5/2481 with at least one differential stage
• CPC Class Codes: H03K 5/249 using clock signals
• CPC Class Codes: H03M 1/366 using current mode circuits, i.e. circuits in which the information is represented by current values rather than by voltage values

Abstract

A method and apparatus for performing analog to digital conversion. A voltage to current converter converts an analog input voltage to an input current. A current reference generates a reference current. A plurality of scaling elements scaled the reference current to yield a plurality of scaled reference currents each corresponding to some voltage level within the dynamic range of the input voltage. The input current is compared to each of the scaled reference currents in a plurality of current comparators to generate a thermometer code from which a digital representation of the analog input voltage is derived.

Claims

1. An A/D converter comprising:

a first voltage to current converter which generates an input current from an analog input voltage;

a current reference for generating first reference current;

a first plurality of scaling elements for generating a plurality of scaled reference currents;

a second plurality of scaling elements for generating a plurality of scaled input currents; and

a plurality of current comparators which compare the scaled input currents to the scaled reference currents to generate a thermometer code.

2. The A/D converter of claim 1 wherein the current reference is a replicate of the first voltage to current converter.

3. The A/D converter of claim 1 wherein a resolution of at least six bits is obtained.

4. The A/D converter of claim 1 wherein the A/D converter is fabricated using a digital CMOS process.

5. The A/D converter of claim 4 wherein no characteristic passive elements are used.

6. A method of converting an analog signal to a digital signal comprising the steps of:

converting a voltage input to an input current;

creating a reference current and a plurality of multiples of the reference current;

comparing the input current to each of the reference current and the multiples of the reference current to generate a thermometer code; and

converting the thermometer code to a digital value.

7. The method of claim 6 wherein the step of comparing compares the input current to all integer multiples of the reference current up to 2^N times the reference current wherein N is a number of bits of resolution of a digital output.

8. The method of claim 6 wherein the step of comparing comprises the steps of:

first comparing the input current to an upper limit of a subrange;

dividing the input current by a predetermined divisor if the comparing step indicates that the input current is greater than the upper limit of the subrange; and

comparing one of the input currents and a divided input current, depending on the outcome of the first comparing step, to each multiple of the reference current within the subrange.

9. The method of claim 8 wherein the step of creating creates integer multiples of the reference current up to 2^N+(1-X) where N is a number of bits of resolution and X is a number of subranges.