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Method and apparatus for application's specific testing of assembled circuits

  • US 6,038,520 A
  • Filed: 10/02/1998
  • Issued: 03/14/2000
  • Est. Priority Date: 10/02/1998
  • Status: Expired due to Term
First Claim
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1. An application specific testing system comprises:

  • a plurality of application specific testing entities, wherein each of the plurality of application specific testing entities is programmable to test at least one of a plurality of assembled circuits;

    a programmable handler operable to pick and place assembled circuits of the plurality of assembled circuits in proximity of corresponding ones of the plurality of application specific testing entities such that placed assembled circuits are subject to testing; and

    a host processing entity operably coupled to the plurality of application specific testing entities and the programmable handler, wherein the host processing entity administers picking and placing by the programmable handler and testing by the plurality of application specific testing entities.

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