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Method and apparatus for measuring ice thickness on substrates using backscattering of gamma rays

  • US 6,049,282 A
  • Filed: 10/05/1998
  • Issued: 04/11/2000
  • Est. Priority Date: 08/30/1994
  • Status: Expired due to Fees
First Claim
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1. A method for measuring ice buildup on an outer surface of a substrate, comprising:

  • providing a gamma ray source in a source holder, the gamma ray source producing a beam of primary gamma rays having sufficient energy to penetrate through said substrate;

    providing a photodetection means behind said source holder and positioning said source holder adjacent to an inner surface of said substrate so that the beam of primary gamma rays are directed through said substrate away from the photodetection means, wherein the source holder shields said photodetection means from primary gamma rays from the gamma ray source and shields said photodetection means from at least some of the gamma rays scattered in said substrate; and

    measuring an intensity of backscattered gamma rays at said photodetection means and determining from said intensity of gamma rays a thickness of ice buildup on said outer surface of said substrate.

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