×

Turn lock bezel for gauge extraction and retention

  • US 6,053,043 A
  • Filed: 03/15/1995
  • Issued: 04/25/2000
  • Est. Priority Date: 03/26/1993
  • Status: Expired due to Fees
First Claim
Patent Images

1. In combination:

  • A) an instrument panel having an aperture that extends axially in said instrument panel and that is bounded by a marginal edge portion of said instrument panel that is disposed peripherally about said aperture;

    B) an instrument gauge that comprises;

    1) electrical input terminal means for receiving an electrical input signal that represents the value of an input to said gauge; and

    2) a front display at which said gauge presents the value of such an electrical input signal;

    C) electrical supply terminal means for separable mating with said input terminal means of said gauge for supplying such an electrical input signal to said input terminal means;

    D) means defining an installed position for said gauge relative to said instrument panel wherein said gauge is disposed in registration with said aperture for removal from the installed position by being extracted via said aperture, and wherein said electrical supply terminal means are separably mated with said input terminal means; and

    E) bezel means comprising;

    1) a front bezel portion that is disposed axially forward of and overlaps both said aperture and said marginal edge portion of said instrument panel and that allows said front display to be viewed by an observer with said gauge being in the installed position; and

    2) gauge extraction means that extends axially rearward from said front bezel portion through said aperture, and, upon said bezel means being bodily displaced axially forward, engages the installed gauge to cause said gauge to be bodily displaced axially forward, and thereby extracted from the installed position.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×