Full field photoelastic stress analysis

• US 6,055,053 A
• Filed: 06/02/1997
• Issued: 04/25/2000
• Est. Priority Date: 06/02/1997
• Status: Expired due to Term

• Current Assignee: Stress Photonics Incorporated
• Original Assignee: Stress Photonics Incorporated
• Inventors: Lesniak, Jon R.
• Primary Examiner(s): Pham, Hoa Q.
• Application Number:
  US08/867,475
• Time in Patent Office: 1,058 Days
• Field of Search: 356/33, 356/34, 356/32, 356/35, 356/364, 356/365-369, 356/381, 356/382, 73/800
• US Class Current: 356/366
• CPC Class Codes: G01L 1/241 by photoelastic stress analysis

Abstract

A structural specimen coated with or constructed of photoelastic material, when illuminated with circularly polarized light will, when stressed; reflect or transmit elliptically polarized light, the direction of the axes of the ellipse and variation of the elliptically light from illuminating circular light will correspond to and indicate the direction and magnitude of the shear stresses for each illuminated point on the specimen. The principles of this invention allow for several embodiments of stress analyzing apparatus, ranging from those involving multiple rotating optical elements, to those which require no moving parts at all. A simple polariscope may be constructed having two polarizing filters with a single one-quarter waveplate placed between the polarizing filters. Light is projected through the first polarizing filter and the one-quarter waveplate and is reflected from a sub-fringe birefringent coating on a structure under load. Reflected light from the structure is analyzed with a polarizing filter. The two polarizing filters and the one-quarter waveplate may be rotated together or the analyzer alone may be rotated. Computer analysis of the variation in light intensity yields shear stress magnitude and direction.

Claims

1. A method for determining shear stresses in a structure comprising the steps of:

coating a structural specimen with a photoelastic material;

loading the structural specimen to produce no more than one-half of a wavelength of birefringence in the photoelastic material;

illuminating with elliptically polarized light the structural specimen coated with the photoelastic material to cause a multiplicity of discrete areas on the structure to reflect elliptically polarized light;

creating an electronic image of a portion of the structural specimen including the multiplicity of discrete areas;

analyzing the elliptically polarized light reflected from the multiplicity of discrete areas of the illuminated specimen to determine the orientation and magnitude of major and minor axes of the elliptically polarized light reflected from each of said multiplicity of specimen areas; and

processing the orientation and magnitude of major and minor axes of the elliptically polarized light for each analyzed area to produce a result indicative of shear stress magnitude and direction in the specimen at each discrete area.

2. The method of claim 1 wherein the structure is illuminated with circularly polarized light.

3. The method of claim 1 wherein the step of analyzing the reflected light at a multiplicity of discrete areas comprises:

rotating a plane polarizer placed to receive the reflected elliptically polarized light from the specimen;

creating the electronic image of the specimen by forming an image of the specimen on an array of light detectors from light transmitted through the rotating plane polarizer; and

analyzing amplitude variation and phase relationship of the light received from each of said multiplicity of discrete areas onto individual light detectors in the array.

4. The method of claim 3 further comprising the step of performing a lock-in operation on the output of each individual light detector in the array which receives light from one of said discrete areas on the specimen, the lock-in processing the data from the light detectors with information of the rotation rate of the rotating plane polarizer and determining phase angle of maximum brightness of each area on the specimen and the magnitude of maximum brightness.

5. The method of claim 1 wherein the specimen has a surface of aluminum and is coated with a photoelastic material by forming an oxide coat on the aluminum surface.

6. The method of claim 5 wherein the oxide coat is of the type formed by an anodizing process.

7. The method of claim 1 wherein the photoelastic material exhibits less that about one-quarter of a wavelength of birefringence.

8. A method for determining shear stresses in a structure comprising the steps of:

coating a structural specimen with a photoelastic material;

loading the structural specimen to produce no more than one-half of a wavelength of birefringence in the photoelastic material;

illuminating with elliptically polarized light the structural specimen coated with the photoelastic material;

analyzing the light reflected from a multiplicity of discrete areas of the illuminated specimen to determine amplitude variations in light reflected from each of said multiplicity of specimen areas and the phase relationship of the amplitude variation in light from each specimen area; and

processing the amplitude variation and phase relationship for each analyzed area to produce a result indicative of shear stress magnitude and direction in the specimen at each discrete area;

wherein the specimen is coated with a photoelastic material, wherein the coating is formulated to attenuate a first wavelength of light to a greater extent than it attenuates a second wavelength of light; and

further comprising the steps of;

illuminating the photoelastic material coating with light of the first wavelength and light of the second wavelength and comparing the relative attenuation of the first wavelength to the second wavelength at the multiplicity of discrete areas on the surface of the specimen so as to determine the thickness of the coating at said multiplicity of discrete areas; and

wherein the step of analyzing the reflected light at the multiplicity of discrete areas includes the step of correcting for the determined thickness at each of said discrete areas.

9. A method of determining the stresses in a transparent birefringent object comprising the steps of:

passing elliptically polarized light through a birefringent object which has been stressed to exhibit a stress induced birefringence of less than one-half wavelength of light so light passing through the birefringent object is elliptically polarized;

obtaining multiple digital images of the elliptically polarized light transmitted through a multiplicity of discrete areas of the birefringent object wherein each digital image is taken through a linear polarizing filter of different orientation;

analyzing the multiple digital images in a digital computer to determine variations in amplitude of the elliptically polarized light transmitted from each of the multiplicity of discrete portions of the surface of the object and the phase of said variations in amplitude of the elliptically polarized light; and

calculating the stress magnitude and direction at each discrete portion of the surface from the determined variation in amplitude and phase of the elliptically polarized light transmitted from each discrete portion of the surface of the object.

10. The method of claim 9 wherein the step of passing elliptically polarized light through the birefringent object is performed with circularly polarized light.

11. A method of measuring magnitude and direction of stresses in an object comprising the steps of:

applying to a surface portion of an object a birefringent coating which attenuates light of a first wavelength and which attenuates light of a second wavelength to a greater extent than the first wavelength;

determining the thickness of the coating at a multiplicity of discrete areas on the object by illuminating the coating with light composed of the first wavelength and the second wavelength and calculating thickness based on differences in attenuation of the first and second wavelengths;

illuminating at least a portion of the birefringent coated portion of the surface of the object with elliptically polarized light; and

determining for a multiplicity of discrete areas within the illuminated portion an amplitude variation and phase angle of said amplitude variation of elliptically polarized light reflected through the birefringent coating on each of the multiplicity of discrete areas.

12. The method of claim 11 wherein the elliptically polarized light is circularly polarized.

13. The method of claim 11 further comprising the step of determining the magnitude and orientation of shear stresses from the amplitude variation and phase angle of each of the multiplicity of discrete areas.

14. The method of claim 11 wherein the step of determining for a multiplicity of discrete areas within the illuminated portion an amplitude variation and phase angle of said amplitude variation of the elliptically polarized light includes imaging the multiplicity of discrete areas through a rotating planar polarizing filter and determining the maximum light amplitude and a phase angle for that amplitude from a selected orientation of the polarizing filter for each of the discrete areas.

15. The method of claim 11 wherein the step of determining for a multiplicity of discrete areas within the illuminated portion an amplitude variation and phase angle of said amplitude variation of the elliptically polarized light at each of the multiplicity of discrete areas comprises:

imaging the multiplicity of discrete areas through at least three plane analyzers at different orientations; and

determining the maximum light amplitude and a phase angle for that amplitude from the images obtained through the at least three plane analyzers.

16. A method of determining the stresses in an object comprising the steps of:

coating a surface of an object in which the stresses are to be measured with a birefringent coating;

loading the object with a stress inducing load to produce no more than one-half of a wavelength of birefringence in the coating;

illuminating the coated surface with elliptically polarized light so light reflected from the surface through the coating is elliptically polarized;

obtaining multiple digital images of the elliptically polarized light reflected from a multiplicity of discrete areas on the surface, wherein each digital image is taken through a linear polarizing filter of different orientation;

analyzing the multiple digital images in a digital computer to determine the variation in intensity of the elliptically polarized light reflected from each of the multiplicity of discrete portions of the surface of the object and the phase angle of said intensity variations in the elliptically polarized reflected light; and

calculating the stress at each discrete portion of the surface from the determined variation in intensity and phase angle of the polarized light reflected from each discrete portion of the surface of the object.

17. The method of claim 16 wherein the elliptically polarized light with which the surface is illuminated is circularly polarized light.

18. A method of determining stresses in a photoelastic structure comprising the steps of:

coating a structural specimen with a photoelastic material;

illuminating the coating on the structure with non-polarized light;

before loading the structure, determining for each of a multiplicity of discrete areas on the structure induced polarization of the light reflected from each discrete area followed by;

illuminating the structure with elliptically polarized light;

loading the structural specimen to produce no more than one-half of a wavelength of birefringence in the plastic material;

creating an electronic image out of a portion of the structure including the multiplicity of discrete areas;

determining for each of the multiplicity of discrete areas on the structure, the direction and magnitude of the ellipse major axis of the elliptically polarized light reflected from each of said multiplicity of discrete areas of the specimen; and

combining with the direction and magnitude of the ellipse major axis, the determined induced polarization of reflected light, to produce a result indicative of shear stresses in the specimen at each discrete area.

19. The method of claim 18 wherein the elliptically polarized light is circularly polarized light.

20. A method of determining shear stress in a specimen comprising the steps of:

chemically altering a surface portion of an object to impart birefringent properties to said surface portion;

loading the object to produce stress induced birefringence in the chemically altered surface portion of the object;

illuminating the chemically altered surface with elliptically polarized light;

analyzing the light reflected from the chemically altered surface portion and determining an orientation and amplitude variation of the elliptically polarized light from each of a plurality of discrete areas on the surface portion of the object.

21. The method of claim 20 wherein the step of chemically altering the surface is performed by oxidation and wherein the surface of the specimen is aluminum.

22. The method of claim 20 wherein the specimen surface is aluminum and the step of chemically altering the surface comprises forming an anodized coating on the specimen surface.

23. The method of claim 20 further comprising the step of determining from the orientation and amplitude variation of the elliptically polarized light reflected from each of the plurality of discrete areas, the magnitude and direction of shear stresses in the surface portion of the object.

24. A method of determining stress in a specimen having an aluminum surface comprising the steps of:

oxidizing an aluminum surface of a specimen to produce a transparent birefringent coating thereon;

loading the specimen to produce birefringence in the transparent birefringent coating;

illuminating the transparent birefringent coating with elliptically polarized light; and

analyzing light reflected from the transparent birefringent coating and determining an orientation and amplitude variation of the elliptically polarized light from each of a plurality of discrete areas on the surface portion of the object.

25. A method of determining stress in a specimen comprising the steps of:

applying a birefringent coating to a surface of a specimen wherein the coating is formulated to attenuate a first wavelength of light to a greater extent than it attenuates a second wavelength of light;

illuminating the birefringent coating with light of the first wavelength and light of the second wavelength and comparing the relative attenuation of the first wavelength to the second wavelength at a multiplicity of discrete areas on the surface of the specimen so as to determine the thickness of the coating at said multiplicity of discrete areas;

determining the amount of induced birefringence in the coating at the multiplicity of discrete areas and correcting the observed birefringence for the determined thickness at each of said multiplicity of discrete areas; and

determining shear stress in the specimen at said multiplicity of discrete areas from said corrected observed birefringence.

26. The method of 25 wherein the coating is formulated to attenuate a third wavelength of light by an amount different from the first wavelength, and unlike the second wavelength of light, and wherein the illuminating of the birefringent coating is with light containing the third wavelength of light, and wherein the step of comparing the attenuation of the first wavelength to the second wavelength includes comparing the third wavelength.

27. A method for determining shear stresses in a structure comprising the steps of:

coating a structural specimen with a photoelastic material;

illuminating with right-handed elliptically polarized light the coated structural specimen;

illuminating with left-handed polarized light the coated specimen;

adding the right-handed elliptically polarized light and the left handed elliptically polarized light reflected from the structural specimen to produce a summed light;

analyzing the summed light reflected from a multiplicity of discrete areas of the illuminated specimen to determine amplitude variations in light reflected from each of said multiplicity of specimen areas and the phase relationship of the amplitude variation in light from each specimen area; and

processing the amplitude variation and phase relationship for each analyzed area to produce a result indicative of shear stress magnitude and direction in the specimen at each discrete area.

28. The method of claim 27 wherein the left-handed elliptically polarized light and the right-handed elliptically polarized light are circularly polarized.