Image processing device and method for detecting the location of the feature of interest in an object image
First Claim
1. An image processing device for detecting a target location in an object image of an object pattern that resembles a reference pattern, said device comprising:
- an imaging device which captures said object image and outputs object image data which represents said object image;
a memory device which stores said object image data, said reference pattern, and a first search zone on said object image to define a maximum searching area for searching for said object pattern in said object image;
a starting point searching means to determine a selected starting point from a plurality of predetermined representative pixel locations for detecting said target location of said object pattern in said first search zone by calculating a feature analysis value representing a degree of resemblance between said reference pattern and said object pattern in a representative scanning window defined by each of said plurality of predetermined representative pixel locations and determining said selected starting point to be the one of said plurality of predetermined representative pixel locations having the highest feature analysis value;
a feature counting means which takes said selected starting point as a center point of a second searching zone, said second searching zone being smaller than said first searching zone, and calculates said feature analysis value representing a degree of resemblance between said reference pattern and said object pattern defined by each pixel location in said second searching zone; and
a first control device to find a specific pixel location in said second searching zone where said object pattern has the highest feature analysis value, and to determine said specific pixel location to be said target location of said object pattern to be detected if said specific pixel location is at said selected starting point, and if not, to reset said second searching zone to a third searching zone whose center pixel is said specific pixel location having the highest feature analysis value, and repeat said calculating said feature analysis value of said object pattern defined by each pixel location in said third searching zone until said calculated feature analysis value for a pixel location in said third searching area is identical to a feature analysis value for an immediately preceding pixel location, and to determine said pixel location to be said target location of said object pattern to be detected.
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Abstract
An image and method for determining the location of known pattern of data in a captured object image wherein a feature analysis is performed upon a representative plurality of pixel locations to determine a starting point, feature analysis is performed upon the pixel locations surrounding the starting point and the starting point is moved to another pixel location if provides a higher feature analysis value than the starting point; the process of performing feature analyses and moving the starting point continues until the starting point is moved a maximum feature analysis value; once the maximum feature analysis value is found, the object image data may be rotated incrementally with respect to the reference pattern data and the feature analysis/starting point selection process repeated for each iteration until an object image location and object angle of rotation is determined.
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Citations
11 Claims
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1. An image processing device for detecting a target location in an object image of an object pattern that resembles a reference pattern, said device comprising:
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an imaging device which captures said object image and outputs object image data which represents said object image; a memory device which stores said object image data, said reference pattern, and a first search zone on said object image to define a maximum searching area for searching for said object pattern in said object image; a starting point searching means to determine a selected starting point from a plurality of predetermined representative pixel locations for detecting said target location of said object pattern in said first search zone by calculating a feature analysis value representing a degree of resemblance between said reference pattern and said object pattern in a representative scanning window defined by each of said plurality of predetermined representative pixel locations and determining said selected starting point to be the one of said plurality of predetermined representative pixel locations having the highest feature analysis value; a feature counting means which takes said selected starting point as a center point of a second searching zone, said second searching zone being smaller than said first searching zone, and calculates said feature analysis value representing a degree of resemblance between said reference pattern and said object pattern defined by each pixel location in said second searching zone; and a first control device to find a specific pixel location in said second searching zone where said object pattern has the highest feature analysis value, and to determine said specific pixel location to be said target location of said object pattern to be detected if said specific pixel location is at said selected starting point, and if not, to reset said second searching zone to a third searching zone whose center pixel is said specific pixel location having the highest feature analysis value, and repeat said calculating said feature analysis value of said object pattern defined by each pixel location in said third searching zone until said calculated feature analysis value for a pixel location in said third searching area is identical to a feature analysis value for an immediately preceding pixel location, and to determine said pixel location to be said target location of said object pattern to be detected. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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Specification