Temperature measurement and compensation scheme
First Claim
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1. An integrated circuit comprising:
- a comparator being coupled in a configuration to compare two voltage signals, one of the two voltage signals comprising a semiconductor junction voltage of a semiconductor device, another of the two voltage signals comprising a voltage signal X Vt, where Vt comprises the thermal voltage and X comprises a selected signal value modulating the thermal voltage;
the comparator configuration including a feedback path to vary X until X Vt approximately equals the semiconductor junction voltage.
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Abstract
An integrated circuit includes: a comparator coupled in a configuration to compare two voltages. One of the two voltages includes a semiconductor junction voltage drop. The other of the two voltages includes a voltage signal, X Vt, where Vt is a thermal voltage and X includes a selected signal value, which modulates the thermal voltage. The configuration includes a feedback path to vary X until X Vt approximately equals the voltage including the semiconductor junction voltage drop.
62 Citations
26 Claims
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1. An integrated circuit comprising:
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a comparator being coupled in a configuration to compare two voltage signals, one of the two voltage signals comprising a semiconductor junction voltage of a semiconductor device, another of the two voltage signals comprising a voltage signal X Vt, where Vt comprises the thermal voltage and X comprises a selected signal value modulating the thermal voltage; the comparator configuration including a feedback path to vary X until X Vt approximately equals the semiconductor junction voltage. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. An integrated circuit circuit comprising:
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a timer circuit to produce for a specified charging time a clock pulse count to compare with a reference clock pulse count adjusted by a temperature compensation clock pulse timing adjustment; a circuit configuration to measure temperature; and a look-up table storing clock pulse timing adjustments, said look-up table responsive to an output signal of said circuit configuration to measure temperature. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15)
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16. A method of testing the frequency of a clock on an integrated circuit comprising:
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producing a clock pulse count for a predetermined electrical charging time; measuring the temperature of the integrated circuit; adjusting a reference clock pulse count based, at least in part, upon the temperature measured; and comparing the clock pulse count produced for the predetermined electrical charging time with the reference clock pulse count adjusted for the measured temperature. - View Dependent Claims (17, 18, 19, 20, 21, 22)
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23. An integrated circuit comprising:
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a first transistor coupled in a configuration to operate as a voltage-controlled substantially constant current source; a second transistor coupled to the first transistor, said second transistor biased to provide a cascode bias with respect to said first transistor; the bias on said second transistor being proportional to the control voltage of said first transistor at a voltage level just sufficient to maintain said first transistor in saturation. - View Dependent Claims (24, 25, 26)
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Specification