Method for plasma treatment and apparatus for plasma treatment
First Claim
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1. A method for plasma treatment, comprising the steps of:
- generating a plasma any of (i) on and (ii) above a wafer in a chamber, measuring the electron density of said plasma; and
detecting the presence of particles suspended in said plasma in said chamber based on any of (i) the magnitude and (ii) the change of said electron density in said plasma.
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Abstract
A method for plasma treatment is disclosed which effects detection of the amount of particles in an plasma generation area measuring the electron density in the particles based on the numerical value of the electric density in the plasma generation area.
23 Citations
17 Claims
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1. A method for plasma treatment, comprising the steps of:
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generating a plasma any of (i) on and (ii) above a wafer in a chamber, measuring the electron density of said plasma; and detecting the presence of particles suspended in said plasma in said chamber based on any of (i) the magnitude and (ii) the change of said electron density in said plasma. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. An apparatus for plasma treatment furnished with a device for retaining a semiconductor wafer subjected to an etching treatment or film forming treatment in a chamber and a high-frequency power for the generation of plasma into said chamber, comprising:
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a microwave irradiating device for irradiating a microwave to an area of said plasma in said chamber; a receiving device for receiving said microwave which has passed through said area of said plasma; a phase difference detecting device for determining the phase difference between said microwave which has impinged on said receiving device and said microwave irradiated from said microwave irradiating device; and an arithmetic device for computing any of(i) a magnitude of electron density in said area of said plasma and (ii) a ratio of change thereof based on said phase difference. - View Dependent Claims (14, 15, 16)
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17. An apparatus for plasma treatment furnished with a device for retaining a semiconductor wafer subjected to an etching treatment or film forming treatment in a chamber and a high-frequency power for the generation of plasma into said chamber, comprising:
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a microelectrode disposed in any of (i) an area for plasma generation and (ii) the proximity thereof and covered with an insulating membrane; a power source for supplying a voltage pulse to said microelectrode; current measuring device for measuring the electric current flowing between said power source and said microelectrode; and an arithmetic device for computing any of (i) the magnitude of electron density in said area for plasma generation and (ii) the ratio of change thereof based on said current.
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Specification