Spinning current method of reducing the offset voltage of a hall device

• US 6,064,202 A
• Filed: 08/24/1998
• Issued: 05/16/2000
• Est. Priority Date: 09/09/1997
• Status: Expired due to Term

• Current Assignee: ams AG (Ams-Osram AG)
• Original Assignee: Physical Electronics Laboratory
• Inventors: Haeberli, Andreas, Steiner, Ralph, Steiner, Franz-Peter, Maier, Christoph
• Primary Examiner(s): PATIDAR, JAY M
• Application Number:
  US09/068,398
• Time in Patent Office: 631 Days
• Field of Search: 324/225, 324/251, 324/207.2, 324/252, 324/117 H, 324/244, 338/32 H, 338/32 R, 323/368, 310/DIG. 3, 327/510, 327/511
• US Class Current: 324/251
• CPC Class Codes: G01R 33/07 Hall effect devices
• CPC Class Codes: G01R 33/075 Hall devices configured for spinning current measurements

Abstract

The method serves for dynamically compensating the offset voltage of a Hall device. The Hall device can have either a platelike structure with at least two contact pairs, or any other arrangement deriveable by conformal mapping. The contact pairs are angled by e.g. 90°. Each pair is supplied with a periodically alternating current whereby the phase shift of the supply currents corresponds to the spatial phase shift of the contact pairs and is e.g. 90°. Superposition of the supplied currents results in a continuously spinning current vector in the Hall device. By measuring simultaneously the voltages between corresponding terminals, a signal consisting of the Hall voltage and a periodic offset voltage can be isolated. The offset voltage is eliminated by averaging the signal over at least one period.

Claims

1. A method of reducing the offset of a Hall device having a generally circular conductive area and at least four electrical contacts connected to the periphery of the circular conductive area in pairs of opposite contacts, the contact pairs being angularly separated from each other by equal spatial angles, or having an arrangement of conductive area and contacts derived by conformal mapping from said arrangement with the circular conductive area, the method comprising

applying to all contact pairs continuously or stepwise alternating currents of a preselected frequency and with phase shifts corresponding to the angles separating the contact pairs from each other to create a bias current rotating in the conductive area continuously or in angular steps smaller than the angles separating the contact pairs,

measuring voltage differences across the conductive area in directions perpendicular to the momentary directions of the bias current in succession for a plurality of evenly spaced bias current directions greater than the number of contacts, and

averaging the voltage differences measured during at least one rotation period of the bias current.

2. The method according to claim 1 wherein the conductive area of the hall device is mounted on a substrate, including keeping the voltage between the center of the conductive area and the substrate constant.

3. The method according to claim 1 wherein the step of measuring includes sampling the voltage differences in directions of the bias currents separated from a reference direction by angles of 2π

n/N, wherein n and N are integers and 0≦

n≦

N, and wherein the step of averaging includes calculating the average from a weighted sum of voltages measured at the contacts.

4. The method according to claim 1 wherein the Hall device comprises two pairs of contacts (A/C, B/D) angularly separated by 90°

.

5. The method according to claim 4 wherein the step of applying includes applying to the two pairs of contacts currents (I_AC, I_BD) which are increased and decreased in equal steps, the currents being separated from each other by a phase angle of n/4 so that alternating currents in the form 0, I, 2I, I, 0, -I, -2I, -I are generated.

6. The method according to claim 5 including sampling voltages at the four contacts (V_A, V_B, V_C, V_D) between the current steps, and the voltage differences are calculated in the sequence V_A -V_C for I_AC =0 and I_BD =2I, followed by (V_D -V_C)+(V_A -V_B);

(V_D -V_B);

(V_D -V_A)+(V_C -V_B);

(V_C -V_A);

(V_B -V_A)+(V_C -V_D);

(V_B -V_D);

(V_B -V_C)+(V_A -V_D).

7. A Hall device comprising

a circular conductive area;

at least four contacts positioned on the circumference of said conductive area in pairs of contacts opposite each other, said contact pairs being angularly spaced from each other by equal angles, or comprising an arrangement of conductive area and pairs of contacts derived by conformal mapping from said arrangement with a circular conductive area;

means for applying to all contact pairs alternating currents at a selected frequency and with phase shifts corresponding to the angles separating said contact pairs from each other for creating a bias current rotating in said conductive area continuously or in angular steps smaller than said angles separating said contact pairs from each other;

means for measuring voltage differences across said conductive area perpendicular to directions of said bias current successively for a plurality of evenly spaced bias current directions greater than the number of contacts; and

means for averaging said voltage differences measured during at least one rotation period of said bias currents.

8. A Hall device according to claim 7 having four contacts spaced from each other by angles of 90°

.

9. A Hall device according to claim 8 wherein said means for measuring includes a matched pair of current sinks and a matched pair of current sources, and means for independently switching said sinks and sources to said four contacts.

10. A Hall device according to claim 7 wherein said circular conductive area is supported on a substrate and lies within a plane of said substrate or is perpendicular to said plane of said substrate.