Semiconductor integrated circuit failure analysis using magnetic imaging

• US 6,064,220 A
• Filed: 07/29/1997
• Issued: 05/16/2000
• Est. Priority Date: 07/29/1997
• Status: Expired due to Term

• Current Assignee: Bell Semiconductor, LLC (Hilco Inc. (d/b/a Hilco Global))
• Original Assignee: LSI Logic Corporation (Broadcom, Inc.)
• Inventors: Graef, Stefan, Sugasawara, Emery
• Primary Examiner(s): Ballato, Josie
• Assistant Examiner(s): TANG, MINH NHUT
• Application Number:
  US08/902,343
• Time in Patent Office: 1,022 Days
• Field of Search: 324/765, 324/158.1, 324/261, 324/529, 324/73.1, 317/235
• US Class Current: 324/754.29
• CPC Class Codes: G01R 31/311 of integrated circuits G01R31/31728 takes precedence
• CPC Class Codes: G01R 31/315 by inductive methods

Abstract

Magnetic sensors are positioned adjacent a semiconductor integrated circuit under test while the circuit is subjected to selected electrical stimuli for purposes of failure analysis. The magnetic image data can be acquired from one or more selected locations about the circuit without any physical connection. By comparing the magnetic sensor information to a predetermined database of magnetic information acquired from known devices, failure modes can be identified. Conventional tester equipment can be used for providing the electrical stimuli to the device under test.

Claims

1. A method of characterizing an integrated circuit having a functional circuitry area and a connection area with a plurality of pins for input and output of electrical signals to the functional circuitry area, comprising the steps of:

producing a magnetic response from the functional circuitry area by applying a predetermined electrical stimulus to at least one of the pins of the connection area,

sensing the magnetic response of the functional circuitry area at each of a plurality of positions across the functional circuitry area of the integrated circuit,

capturing a quantitative indication of a strength of the magnetic response at each of the plurality of positions across the functional circuitry area of the integrated circuit,

creating a magnetic response array for the functional circuitry area based on the captured quantitative indications of the magnetic field strength at the plurality of positions, and

comparing the magnetic response array of the integrated circuit to at least one predetermined magnetic response array for a reference integrated circuit having a known characteristic; and

characterizing the integrated circuit based at least in part on the comparison between the integrated circuit and the reference integrated circuit.

2. The method of claim 1 wherein the known characteristic of the reference integrated circuit is that the reference integrated circuit is fully functional within specified tolerances.

3. The method of claim 1 wherein the known characteristic of the reference integrated circuit is that the reference integrated circuit has at least one known defect.

4. The method of claim 1 wherein the magnetic responses further comprise at least one of magnetic reflections, magnetic resonances, magnetic fields, and magnetic waves.

5. The method of claim 1 wherein the predetermined electrical stimulus further comprises a magnetic stimulus.

6. The method of claim 1 wherein the step of sensing the magnetic response of the functional circuitry area at each of a plurality of positions across the functional circuitry area of the integrated circuit is performed by a separate sensor at each of the plurality of positions.

7. The method of claim 1 wherein the magnetic response array includes a graphical representation of the strength of the magnetic responses.

8. The method of claim 7 wherein digital signal processing is used in the step of comparing the graphical representation for the integrated circuit to the at least one predetermined magnetic response array for the reference integrated circuit.

9. A method of characterizing integrated circuits of a predetermined design, the predetermined design including a functional circuitry area and a connection area with a plurality of pins for input and output of electrical signals to the functional circuitry area, comprising the steps of:

creating a database relating magnetic response arrays to integrated circuit characteristics, by;

analyzing at least one reference integrated circuit of the predetermined design, where the characteristics of the reference integrated circuit are known, the analysis including;

producing a magnetic response from the functional circuitry area of the integrated circuit by applying a predetermined electrical stimulus to at least one of the pins of the connection area,

sensing the magnetic response of the functional circuitry area at each of a plurality of positions across the functional circuitry area of the integrated circuit,

capturing a quantitative indication of a strength of the magnetic response at each of the plurality of positions across the functional circuitry area of the integrated circuit, and

creating a magnetic response array for the functional circuitry area based on the captured quantitative indications of the magnetic field strength at the plurality of positions,

correlating the magnetic response array produced by the analysis with the known characteristics of the integrated circuit, and

storing the correlated magnetic response array and the known characteristics of the integrated circuit in a record in the database,

performing the steps of analysis on an uncharacterized integrated circuit of the predetermined design,

comparing the magnetic response array for the uncharacterized integrated circuit with the magnetic response arrays for the reference integrated circuits in the database,

selecting a record in the database based at least in part on similarities between the magnetic response array for the uncharacterized integrated circuit and the magnetic response array in the selected record, and

characterizing the uncharacterized integrated circuit based at least in part on the characteristics for the reference integrated circuit listed in the selected record.

10. The method of claim 9 wherein the known characteristic of the reference integrated circuit is that the reference integrated circuit is fully functional within specified tolerances.

11. The method of claim 9 wherein the magnetic responses further comprise at least one of magnetic reflections, magnetic resonances, magnetic fields, and magnetic waves.

12. The method of claim 9 wherein the predetermined electrical stimulus further comprises a magnetic stimulus.

13. The method of claim 9 wherein the step of sensing the magnetic response of the functional circuitry area at each of a plurality of positions across the functional circuitry area of the integrated circuit is performed by a separate sensor at each of the plurality of positions.

14. The method of claim 9 wherein the magnetic response array includes a graphical representation of the strength of the magnetic responses.

15. The method of claim 14 wherein digital signal processing is used in the step of comparing the graphical representation for the integrated circuit to the at least one predetermined magnetic response array for the reference integrated circuit.

16. A testing system for characterizing an integrated circuit having a functional circuitry area and a connection area with a plurality of pins for input and output of electrical signals to the functional circuitry area, comprising:

a socket for receiving the integrated circuits and making electrical connections to the integrated circuit,

means for applying a predetermined electrical stimulus through the electrical connections of the socket to at least one of the pins of the connection area and thereby producing a magnetic response from the functional circuitry area of the integrated circuit,

means for sensing the magnetic response of the functional circuitry area at each of a plurality of positions across the functional circuitry area of the integrated circuit,

means for capturing a quantitative indication of a strength of the magnetic response at each of the plurality of positions across the functional circuitry area of the integrated circuit,

means for creating a magnetic response array for the functional circuitry area based on the captured quantitative indications of the magnetic field strength at the plurality of positions, and

means for comparing the magnetic response array of the integrated circuit to at least one predetermined magnetic response array for a reference integrated circuit having a known characteristic; and

means for characterizing the integrated circuit based at least in part on the comparison between the integrated circuit and the reference integrated circuit.

17. The system of claim 16 wherein the means for sensing the magnetic responses further comprise means for sensing at least one of magnetic reflections, magnetic resonances, magnetic fields, and magnetic waves.

18. The system of claim 16 wherein the means for sensing the magnetic response of the functional circuitry area at each of a plurality of positions across the functional circuitry area of the integrated circuit further comprises a separate sensor at each of the plurality of positions.

19. The system of claim 16 wherein the means for creating the magnetic response array further comprises means for creating a graphical representation of the strength of the magnetic responses.

20. The system of claim 19 wherein the means for comparing the magnetic response array of the integrated circuit to at least one predetermined magnetic response array for a reference integrated circuit further comprises digital signal processing means to compare the graphical representation for the integrated circuit to a graphical representation for the at least one predetermined magnetic response array for the reference integrated circuit.