Diagnostic method with pre-assembly fault recording lock-out

• US 6,067,642 A
• Filed: 02/21/1995
• Issued: 05/23/2000
• Est. Priority Date: 02/21/1995
• Status: Expired due to Fees

• Current Assignee: Automotive Systems Laboratory, Incorporated (Ningbo Junsheng Investment Group Co., Ltd.)
• Original Assignee: Automotive Systems Laboratory, Incorporated (Ningbo Junsheng Investment Group Co., Ltd.)
• Inventors: Paye, James R.
• Primary Examiner(s): TU, CHRISTINE TRINH LE
• Application Number:
  US08/390,985
• Time in Patent Office: 1,918 Days
• Field of Search: 395/183.21, 395/184.01, 395/185.01, 395/183.2, 395/183.01, 395/183.06, 395/185.1, 395/183.16, 395/180, 714/45, 714/31, 714/47, 714/48, 714/44, 714/25, 714/30, 714/57
• US Class Current: 714/45
• CPC Class Codes: G06F 11/22 Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing

Abstract

A diagnostic method (100) with pre-assembly fault recording lock-out inhibits fault recording during assembly of a main system until the system has been determined operation at least once (116). The method will still note the detection of system failures/errors (112) by activating a warning lamp (120), but will not record these faults into memory until the system has determined that the main system has been powered up without any errors at least once (118 and 122). Thus, since these faults are not stored in memory during manufacture/assembly, the method of the present invention obviates the need for any additional assembly step(s) of erasing and/or clearing the memory, or externally controlled recording inputs for the diagnostic system.

Claims

1. In a diagnostic system comprising means for monitoring and evaluating an operational status of a device and a memory for recording the operational status, a method for controlling the recording of a fault status comprising the steps of:

(a) determining if an error has been detected;

(b) determining whether said device has been operational at least a first time;

(c) in response to said device not having been operational at least a first time, not recording said detected error in said memory; and

(d) in response to said device having been operational at least a first time, recording the detected error in said memory.

2. The method of claim 1 further comprising the step of

if an error has not been detected;

and

said device has not been operational a first time, recording in said memory that said device has been detected as being operational a first time.

3. The method of claim 1 wherein the step of determining whether said device has been operational at least a first time comprises accessing the operational status stored in said memory.

4. The method of claim 1 wherein said device comprises a main circuit component having a plurality of subcircuit components, and said step of determining whether said main circuit component has been operational at least a first time inhibits said diagnostic system from recording detected faults in said memory during periodic assembly testing of said main circuit component.

5. The method of claim 1 wherein step (c) further comprises activating a warning means.