Photo sensor integrated circuit

• US 6,069,378 A
• Filed: 12/04/1997
• Issued: 05/30/2000
• Est. Priority Date: 12/05/1996
• Status: Expired due to Term

• Current Assignee: DENSO Corporation
• Original Assignee: DENSO Corporation
• Inventors: Inoue, Keijiro, Toyoda, Inao, Suzuki, Yasutoshi
• Primary Examiner(s): Saadat, Mahshid
• Assistant Examiner(s): Wilson, Allan R.
• Application Number:
  US08/985,043
• Time in Patent Office: 908 Days
• Field of Search: 257/292, 257/293, 257/294, 257/434, 257/435, 257/463, 438/57, 438/73
• US Class Current: 257/294
• CPC Class Codes: H01L 27/1443 with at least one potential jump or surface barrier
• CPC Class Codes: Y10T 428/19 Sheets or webs edge spliced or joined
• CPC Class Codes: Y10T 428/236 Honeycomb type cells extend perpendicularly to nonthickness layer

Abstract

A photo diode and a signal processing circuit are formed on a silicon substrate. The signal processing circuit comprises a PNP transistor and an NPN transistor. A region of the signal processing circuit on the silicon substrate is covered by an aluminum thin film functioning as a shielding film. A covered distance L(μm) is defined as an overhang of the aluminum thin film from the edge of the PNP transistor, and is determined based on a ratio of a minimum current of the PNP transistor, which induces malfunction in the signal processing circuit under the solar radiation, to a current generated in the circuit element when subjected to the solar radiation without the aluminum thin film.

Claims

1. A photo sensor integrated circuit comprising:

photoelectric transfer means for converting received light into photoelectric current when subjected to solar radiation;

signal processing means for processing the photoelectric current of said photoelectric transfer means; and

a semiconductor substrate for integrating said photoelectric transfer means and said signal processing means as one chip component, said semiconductor substrate including a shielding film covering a circuit element that is part of said signal processing means;

wherein an amount of the substrate covered by the shielding film L (μ

m) satisfies the following relationship so as to eliminate malfunction of the signal processing means which may be induced by diffusion of incoming light reaching from outside said shielding film ##EQU7## where Io represents a current generated in said circuit element when subjected to 100,000 lux light irradiation without said shielding film, which Imal(min) represents a minimum current of said circuit element which induces malfunction in said signal processing means under the 100,000 lux light irradiation.

2. The photo sensor integrated circuit in accordance with claim 1, wherein said covered amount L is larger than 0 and is smaller than a gap between said edge of said circuit element and a peripheral edge of said chip component.

3. The photo sensor integrated circuit in accordance with claim 2, wherein a plurality of electrode pads for outputting signals from said circuit element are provided along the peripheral edge of said chip component.

4. A photo sensor integrated circuit comprising:

a semiconductor substrate for integrating components of the circuit;

photoelectric transfer means for converting received light into photoelectric current, the photoelectric transfer means being formed on a first portion of a surface of the substrate;

signal processing means for processing the photoelectric current, the signal processing means (i) being formed on a second portion of the surface of the substrate, and (ii) integrated with the photoelectric transfer means, the photoelectric transfer means and the signal processing means forming a single chip component; and

a shielding film formed on the surface of the substrate and for preventing a malfunction of the circuit when the circuit is subjected to solar radiation, the shielding film (i) covering the signal processing means, (ii) partially covering a remaining portion of the substrate, and (iii) preventing the malfunction of the signal processing means when the substrate is subjected to the solar radiation;

wherein an amount of the remaining portion of the substrate covered by the shielding film L (μ

m) satisfies the following relationship so as to eliminate the malfunction of the signal processing means which may be induced by diffusion of incoming light radiating from outside the shielding film ##EQU8## where Io represents a current generated in the circuit when subjected to 100,000 lux light irradiation without the shielding film, while Imal(min) represents a minimum current of a circuit element of the signal processing means which induces the malfunction in the signal processing means under the 100,000 lux light irradiation.

5. The photo sensor integrated circuit in accordance with claim 4, wherein the amount of the remaining portion of the substrate covered by the shielding film L is larger than 0 and is smaller than a gap between the edge of the circuit element and a peripheral edge of the chip component.

6. The photo sensor integrated circuit in accordance with claim 5, wherein a plurality of electrode pads for outputting signals from the circuit element are provided along the peripheral edge of the chip component.