Device transfer and reinspection method for IC handler

• US 6,075,216 A
• Filed: 07/07/1997
• Issued: 06/13/2000
• Est. Priority Date: 06/30/1994
• Status: Expired due to Fees

• Current Assignee: Advantest Corporation
• Original Assignee: Advantest Corporation
• Inventors: Suzuki, Katsuhiko, Kobayashi, Yoshihito, Nakamura, Hiroto
• Primary Examiner(s): Bollinger, David H.
• Application Number:
  US08/888,745
• Time in Patent Office: 1,072 Days
• Field of Search: 209/573, 209/571, 209/556, 414/222, 414/224, 414/404
• US Class Current: 209/573
• CPC Class Codes: G01R 31/01 Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station testing of cables continuously passing the testing apparatus G01R31/59; testing dielectric strength or breakdown voltage G01R31/12
• CPC Class Codes: G01R 31/2893 Handling, conveying or loading, e.g. belts, boats, vacuum fingers G01R31/2867 takes precedence; handling semiconductor devices or wafers during manufacture or treatment H01L21/67
• CPC Class Codes: H01L 21/67271 Sorting devices

Abstract

An IC device transfer method for IC handler accommodates both a tray and a rod-shaped magazine. The tray installs a plurality of IC devices which transport in horizontal directions in the IC handler. The rod-shaped magazine installs a plurality of IC devices which transport in vertical directions in the IC handler. A device reinspection method in the IC test handler reinspects the IC devices stored in the tray or magazine without human intervention, sorts in accordance with the test results, and stores in either the rod-shaped magazine or the tray. For this purpose, a tray supply section transfers a user tray to a test tray, whereas a magazine supply section and a pick carrier section transfer a rod-shaped magazine to the test tray. An inspection setting sets the number of reinspection, the classification of inspection results, and the storage tray/magazine. The IC devices are loaded from the magazine and the user tray to the test tray and are tested. When a reinspection mode is effective, the IC devices to be reinspected are stored in the unloader section and transferred to the loader section by the tray transfer system to test the IC devices again. When the reinspection mode is completed, the IC device are sorted by categories and stored in the tray/magazine.

Claims

1. A device reinspection method for use in an IC test handler, comprising the steps of:

setting inspection parameters by specifying a number of reinspection, a classification of inspection results, and storage trays/magazines;

starting to operate said IC test handler (221), loading IC devices to be tested (215) from a rod-shaped magazine or a customer tray to a test tray (180), and testing said IC devices;

sorting and storing said IC devices that have been tested per each category and finalizing the test when a reinspection mode is not effective;

when the reinspection mode is effective, storing all of said IC devices (215) to be reinspected in a customer tray (216) provided at an unloader section (223), transferring said customer tray having said IC devices to be reinspected to a loader section (222) using a tray transfer system (227); and

starting to operate (202) said IC test handler again (221), loading said IC devices (215) to be reinspected from said customer tray (216) of said loader section (222) to said test tray (180), performing a second test (204), and completing the test for said IC devices (215) by sorting and storing per category.

2. The device reinspection method in the IC test handler of claim 1, wherein said steps of sorting and storing per category are performed only for a magazine provided at a magazine unloader section (243).

3. The device reinspection method in the IC test handler of claim 1, wherein said steps of sorting and storing per category are performed for both of a magazine of a magazine unloader section (243) and a customer tray (216) of the unloader section (223).

4. The device reinspection method in the IC test handler of claim 1, wherein said steps of sorting and storing (212) per category are performed only for the customer tray (216) of the unloader section (223).

5. A device transfer method to be used in an IC handler for transferring IC devices to be tested from a device loading area to a test area of said IC handler through a test tray (180), comprising the following steps of:

installing a plurality of user trays (170) in a tray supply section (172) provided at said device loading area, each of said user trays (170) carrying IC devices to be tested on a horizontal plane;

replacing said user trays (170) with test trays (180) by a tray conversion section (173), said test trays (180) being circulated within said IC handler by predetermined movements in a horizontal direction;

transferring said user trays from said tray supply section (172) to said tray conversion section (173) so that said IC devices in said user trays (170) are picked therefrom and placed on said test trays (180);

providing rod-shaped magazines (150) having IC devices to be tested to a supply magazine transfer mechanism (154) in a manner for allowing a downward movement of said IC devices by means of own gravities in said rod-shaped magazines (150);

receiving said IC devices from said supply magazine transfer mechanism (154) during said downward movement and converting an angle of movement of said IC devices from said downward movement to a horizontal movement and placing said IC devices on carriers (112b) which are aligned in a horizontal direction; and

transferring said IC devices on said carrier to said tray conversion section (173) and placing said IC devices on said test trays (180).

6. A device transfer method to be used in an IC handler for transferring IC devices that have been tested from a test area to a storage area of said IC handler, comprising the following steps of:

receiving a plurality of test trays (180) transferred from said test area of said IC handler, each of said test trays (170) having IC devices that have been tested on a horizonal plane;

transferring said IC devices on said test tray (180) to a user tray (170) based on test results;

providing a plurality of rod-shaped magazines (150), said rod-shaped magazines (150) being aligned at least partially in a vertical direction to allow a downward movement of IC devices in said magazines by self-gravities; and

transferring the IC devices on said test tray (180) to said rod-shaped magazine (150) based on said test results by a magazine storage transfer section (120), said magazine storage transfer section (120) including a carrier (122) for receiving each of said IC devices on a plane seat and rotating said horizontal plane seat so that said IC device sliding in said magazine by said downward movement caused by said gravity.