Method and apparatus for terahertz tomographic imaging

• US 6,078,047 A
• Filed: 06/17/1997
• Issued: 06/20/2000
• Est. Priority Date: 03/14/1997
• Status: Expired due to Term

• Current Assignee: Lucent Technologies, Inc. (Nokia Corporation)
• Original Assignee: Lucent Technologies, Inc. (Nokia Corporation)
• Inventors: Mittleman, Daniel Matthew, Nuss, Martin C.
• Primary Examiner(s): Westin, Edward P.
• Assistant Examiner(s): HANIG, RICHARD E
• Application Number:
  US08/877,054
• Time in Patent Office: 1,099 Days
• Field of Search: 250/338.1, 250/330, 250/341.1
• US Class Current: 250/338.1
• CPC Class Codes: G01N 21/3563 for analysing solids; Preparation of samples therefor
• CPC Class Codes: G01N 21/3586 by Terahertz time domain spectroscopy [THz-TDS]
• CPC Class Codes: G01N 21/49 within a body or fluid

Abstract

Providing a compositional image of an object in real time is accomplished by illuminating the object with a waveform comprising pulses of electromagnetic radiation in the terahertz frequency range and measuring the relative time delays of pulses reflected by the object to determine the positions of dielectric interfaces in the object. According to a further embodiment, the waveform includes one or more pulses of terahertz radiation, each pulse having a duration in the range of approximately 10 to 10,000 femtoseconds.

Claims

1. A method of providing a compositional image of an object in real time including the steps of:

(a) illuminating the object with a waveform comprising pulses of electromagnetic radiation in the terahertz frequency range, and

(b) measuring the relative time delays of pulses reflected by the object to determine the positions of discontinuities in the object.

2. The method of claim 1 wherein the pulses of electromagnetic radiation include one or more pulses having a duration in the range of approximately 10 to 10,000 femtoseconds.

3. The method of claim 1 wherein the discontinuities are dielectric interfaces.

4. The method of claim 3 wherein the step of measuring further includes the step of using the relative time delays to provide a full-volume image of the object in real time, wherein the full-volume image is defined as an image that shows the locations of compositional discontinuities within the volume of the object.

5. A method of providing a compositional image of an object in real time including the steps of:

(a) illuminating the object with a waveform comprising pulses of electromagnetic radiation in the terahertz frequency range, the object reflecting at least a portion of the electromagnetic radiation as reflected pulses, the electromagnetic radiation traveling substantially along a direction of propagation defined by a set of parallel axes,

(b) receiving the reflected pulses at a detector,

(c) measuring the arrival times of each of a plurality of reflected pulses as received at the detector; and

(d) from the arrival times, determining the location of dielectric interfaces in the object along the direction of propagation.

6. The method of claim 5 wherein the pulses of electromagnetic radiation include one or more pulses having a duration in the range of approximately 10 to 10,000 femtoseconds.

7. The method of claim 6 wherein the pulses of electromagnetic radiation include a first pulse separated in time from a second pulse, and the step of measuring further comprises the step of determining elapsed time between receipt of the first pulse as reflected by the object and receipt of the second pulse as reflected by the object.

8. The method of claim 7 wherein the step of measuring further includes the step of using the elapsed time to provide a full-volume image of the object in real time, wherein the full-volume image is defined as an image that shows the locations of compositional discontinuities within the volume of the object.

9. The method of claim 5 wherein the pulses reflected by the object are analyzed in the time domain to provide a 3-dimensional tomographic image of the object.

10. The method of claim 5 wherein the analysis of the reflected waveform uses the arrival times of reflected pulses to determine the location of dielectric interfaces along the direction of propagation of the terahertz radiation.

11. An apparatus for providing a compositional image of an object in real time including:

(a) a source of electromagnetic energy for illuminating the object with pulses of radiation in the terahertz frequency range, and

(b) a measuring device for determining the positions of discontinuities in the object by measuring the relative time delays of pulses reflected by the object.

12. The apparatus of claim 11 wherein the source of electromagnetic energy produces pulses each having a duration in the range of approximately 10 to 10,000 femtoseconds.

13. The apparatus of claim 11 wherein the object includes discontinuities in the form of dielectric interfaces.

14. The apparatus of claim 11 further including an imaging device coupled to the measuring device for using the relative time delays to provide a full-volume image of the object in real time, the full-volume image including compositional information about the object.

15. An apparatus for providing a compositional image of an object in real time including:

(a) a source of electromagnetic energy for illuminating the object with pulses of electromagnetic radiation in the terahertz frequency range, the object reflecting at least a portion of the electromagnetic radiation as reflected pulses, the electromagnetic radiation traveling substantially along a direction of propagation defined by a set of parallel axes,

(b) a detector for receiving the reflected pulses,

(c) a measuring device coupled to the detector for measuring the arrival times of each of a plurality of reflected pulses as received at the detector; and

(d) a calculating device for determining, from the arrival times, the location of dielectric interfaces in the object along the direction of propagation.

16. The apparatus of claim 15 wherein the pulses of electromagnetic radiation include one or more pulses having a duration in the range of approximately 10 to 10,000 femtoseconds.

17. The apparatus of claim 16 wherein the pulses of electromagnetic radiation include a first pulse separated in time from a second pulse, and the measuring device further comprises a device for determining elapsed time between receipt of the first pulse as reflected by the object and receipt of the second pulse as reflected by the object.

18. The apparatus of claim 17 further including an imaging device, coupled to the measuring device, adapted for using the elapsed time to provide a full-volume image of the object in real time, wherein the full-volume image is defined as an image that shows the locations of compositional discontinuities within the volume of the object.

19. The apparatus of claim 18 wherein the object comprises a gas or a gas mixture, and the imaging device is adapted to generate an image of the gas or gas mixture using linear predictive coding.

20. The apparatus of claim 19 wherein the measuring device analyzes pulses reflected by the object in the time domain, so as to permit the imaging device to provide a 3-dimensional tomographic image of the object.

21. The apparatus of claim 15 wherein the analysis of the reflected waveform uses the arrival times of reflected pulses to determine the location of dielectric interfaces along the direction of propagation of the terahertz radiation.

22. A method of providing an image of an object in real time including the steps of:

(a) illuminating the object with a waveform comprising pulses of electromagnetic radiation in the terahertz frequency range, the object reflecting at least a portion of the electromagnetic radiation as reflected pulses, the electromagnetic radiation traveling substantially along a direction of propagation defined by a set of parallel axes,

(b) receiving the reflected pulses at a detector,

(c) measuring the arrival times of each of a plurality of reflected pulses as received at the detector;

(d) signal processing and filtering the plurality of reflected pulses to obtain an approximation of an impulse response function for the object;

(e) converting the measured arrival times into depth information for the object; and

(f) obtaining one or more materials properties of the object from the impulse response function for the object.

23. The method of claim 22 wherein the signal processing step includes deconvolving the reflected pulses with a reference waveform.

24. The method of claim 22 wherein the filtering step includes a wavelet filtering process for removing noise accumulated in the deconvolution process.

25. The method of claim 22 wherein the materials properties include a refractive index profile for the object.

26. The method of claim 25 wherein information about the refractive index profile of the object is determined from the magnitude of the reflection coefficient of each dielectric discontinuity.

27. The method of claim 22 further including the step of calculating signal attenuation of reflected pulses due to one or more reflections and/or absorptions from compositional layers situated between the illuminating electromagnetic radiation and a specified discontinuity in the object.