Method for forming vertical interconnect process for silicon segments with dielectric isolation
First Claim
1. A method of forming a segment of silicon having a plurality of edges defining said segment, the method comprising the steps of:
- providing one or more die on said segment, each of said die including a plurality of first bond pads;
locating a plurality of edge bond pads located on more than one of said edges of said segment for external electrical connections;
connecting one or more layers of metal traces between said plurality of first bond pads to interconnect said die, said metal traces further connected between said plurality of edge bond pads and said plurality of first bond pads to connect said die to said external connections,forming a conformal dielectric coating around the edge of said die and over said bond pads;
making openings in the conformal coating at selected locations to form openings for making electrical connections to said bond pads; and
wherein said segment further includes a front side and a backside, and wherein said plurality of first bond pads, said plurality of edge bond pads, and said layer of metal traces are located on said front side of said segment.
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Accused Products
Abstract
A method for vertically interconnecting stacks of silicon segments. Each segment includes a plurality of adjacent die on a semiconductor wafer. The plurality of die on a segment are interconnected on the segment using one or more layers of metal interconnects which extend to all four sides of the segment to provide edge bonding pads for external electrical connection points. After the die are interconnected, each segment is cut from the backside of the wafer using a bevel cut to provide four inwardly sloping edge walls on each of the segments. After the segments are cut from the wafer, the segments are placed on top of one another to form a stack. Vertically adjacent segments in the stack are electrically interconnected by applying electrically conductive epoxy to one or more sides of the stack. The inwardly sloping edge walls of each of the segments in the stack provide a recess which allows the electrically conductive epoxy to access the edge bonding pads and lateral circuits on each of the segments once the segments are stacked. A dielectric coating is applied to the die to provide a conformal coating to protect and insulate the die and a laser is used to ablate the area over the bond pads to remove the dielectric coating in order to provide for electrical connections to the bond pads.
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Citations
19 Claims
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1. A method of forming a segment of silicon having a plurality of edges defining said segment, the method comprising the steps of:
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providing one or more die on said segment, each of said die including a plurality of first bond pads; locating a plurality of edge bond pads located on more than one of said edges of said segment for external electrical connections; connecting one or more layers of metal traces between said plurality of first bond pads to interconnect said die, said metal traces further connected between said plurality of edge bond pads and said plurality of first bond pads to connect said die to said external connections, forming a conformal dielectric coating around the edge of said die and over said bond pads; making openings in the conformal coating at selected locations to form openings for making electrical connections to said bond pads; and wherein said segment further includes a front side and a backside, and wherein said plurality of first bond pads, said plurality of edge bond pads, and said layer of metal traces are located on said front side of said segment. - View Dependent Claims (2, 3, 4)
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5. A method of forming a stack of electrical circuitry, the method comprising the steps of:
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vertically placing a stack of segments on top of one another, each of said segments including a plurality of die having circuitry therein, and electrically conductive contact points; interconnecting said plurality of die on each of said segments and connecting one or more of said plurality of die to one or more of said electrically conductive contact points on each of said segments; providing access to said electrically conductive contact points on each of said segments; electrically interconnecting said electrically conductive contact points on each of said segments in said stack, and providing a lateral electrical connection to said plurality of die located in each of said segments in said stack, forming a conformal dielectric coating around the edge of said die and over said bond pads; making openings in said conformal coating at selected locations for making electrical connections to said contact points; wherein said electrically conductive points are located along more than one of said edges on each of said segments; including more than one layer of metal traces; and wherein said layer of metal traces includes a sandwich of chrome titanium-tungsten, and gold. - View Dependent Claims (6, 7, 8, 9, 10, 11, 12, 13)
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14. A method of forming a stack of segments, comprising the steps of:
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providing a wafer having a plurality of die; creating a plurality of segments, each one of said plurality of segments formed by grouping a plurality of adjacent ones of said die on said wafer; interconnecting said plurality of adjacent die on said each of said plurality of segments; separating said each one of said plurality of segments from said wafer; placing said plurality of segments on top of one another to create a stack of segments, said stack having external vertical sides; electrically interconnecting said stack of segments; forming a conformal dielectric coating around the edge of said die and over said bond pads; making openings on said conformal coating at selected locations for making electrical connections to said contact points, providing internal electrically conductive contact points on each of said plurality of die; providing external electrically conductive contact points on said each one of said plurality of segments; providing a layer of metal traces on said each one of said plurality of segments, said metal traces extending between said internal electrically conductive contact points on said plurality of die and said external electrically conductive contact points on said each one of said plurality of seaments; applying electrically conductive epoxy to more than one of said external vertical sides of said stack such that said electrically conductive epoxy is in contact with said external electrically conductive contact points on said each one of said segments in said stack, to thereby electrically interconnect said plurality of segments in said stack. - View Dependent Claims (15, 16, 17, 18, 19)
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Specification