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Polymer marker

  • US 6,087,192 A
  • Filed: 09/02/1999
  • Issued: 07/11/2000
  • Est. Priority Date: 09/03/1998
  • Status: Expired due to Term
First Claim
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1. A method of making a semiconductor device situated within a package with conductive leads extending from the package, said method comprising the steps of:

  • testing a plurality of said semiconductor devices so as to determine defective devices; and

    marking said defective devices with a polymer marker able to withstand temperatures in excess of 200 C., acids with a pH of less than 2, and basic solutions with a pH of greater than 11.

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