IC testing device

• US 6,087,844 A
• Filed: 09/24/1997
• Issued: 07/11/2000
• Est. Priority Date: 09/27/1996
• Status: Expired due to Fees

• Current Assignee: Yokogawa Electric Corporation
• Original Assignee: Ando Electric Co., Ltd. (Yokogawa Electric Corporation)
• Inventors: Kimata, Yoshiaki
• Primary Examiner(s): BROWN, GLENN WARNER
• Application Number:
  US08/936,266
• Time in Patent Office: 1,021 Days
• Field of Search: 324/754, 324/765, 324/158.1
• US Class Current: 324/762.02
• CPC Class Codes: G01R 31/3167 Testing of combined analog and digital circuits testing ADC's H03M1/1071
• CPC Class Codes: G01R 31/31907 Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Abstract

The object of the present invention is to offer an IC testing device capable of operating a plurality of test stations independently of each other. A solid-state relay 11 is provided on each test station, and performs ON/OFF control of a 200 V AC supply to a first power source 9 and a second power source 10. Additionally, the analog circuit 7 and pin electronics section 8 of each test station are respectively connected to a DC section 5 of an IC testing device main body 2 by testing buses. Similarly, the analog circuit 7 and pin electronics section 8 of each test station are respectively connected to an LS section 6 of an IC testing device main body 2 by testing buses. Consequently, each unit of a test station is capable of exchanging data with the IC testing device main body 2 even if only the solid-state relay 11 of one testing station is ON.

Claims

1. An integrated circuit testing device comprising at least two test stations for testing separate integrated circuits, each test station having:

an analysis unit for analyzing characteristics of a corresponding integrated circuit based on signals from control means;

a power source for supplying electrical voltage to said analysis unit; and

power source control means for performing ON/OFF control of said power source.

2. An integrated circuit testing device in accordance with claim 1, wherein each of said analysis units directly exchanges signals with its associated control means.

3. An integrated circuit testing device in accordance with claim 2, wherein each power source has an analog power supply section, said analog power supply section being grounded separately for each test station.

4. An integrated circuit testing device in accordance with claim 1, wherein each power source has an analog power supply section, said analog power supply section being grounded separately for each test station.