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Compound switching matrix for probing and interconnecting devices under test to measurement equipment

  • US 6,100,815 A
  • Filed: 12/24/1997
  • Issued: 08/08/2000
  • Est. Priority Date: 12/24/1997
  • Status: Expired due to Term
First Claim
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1. A compound switching matrix apparatus for interconnecting a set of devices that each include first and second contacts to first and second sets of terminals on a measurement system, comprising:

  • a first set of probes contacting the first contacts on the set of devices;

    a second set of probes contacting the second contacts on the set of devices;

    first set of probe matrix relays mounted on a first circuit board for selectively interconnecting the first set of probes to a first set of inter-matrix conductors;

    a second set of probe matrix relays mounted on a second circuit board for selectively interconnecting the second set of probes to a second set of inter-matrix conductors, the first and second circuit boards electrically isolating the first set of probe matrix relays and inter-matrix conductors from the second set of probe matrix relays and inter-matrix conductors;

    a first set of configuration matrix relays selectively interconnecting the first set of terminals on the measurement system to the first set of inter-matrix conductors;

    a second set of configuration matrix relays selectively interconnecting the second set of terminals on the measurement system to the second set of inter-matrix conductors; and

    a laser that cooperates with the measurement system to laser trim a device in the set of devices to a predetermined value.

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