Automatic ranging apparatus and method for precise integrated circuit current measurements

• US 6,101,458 A
• Filed: 10/30/1997
• Issued: 08/08/2000
• Est. Priority Date: 10/30/1997
• Status: Expired due to Term

• Current Assignee: Bell Semiconductor, LLC (Hilco Inc. (d/b/a Hilco Global))
• Original Assignee: LSI Logic Corporation (Broadcom, Inc.)
• Inventors: Irrinki, V. Swamy, Gouravaram, Sudhakar R., Sugasawara, Emery
• Primary Examiner(s): Hoff, Marc S.
• Assistant Examiner(s): Bui, Bryan
• Application Number:
  US08/961,163
• Time in Patent Office: 1,013 Days
• Field of Search: 702/119, 702/129, 702/121, 702/122, 702/123, 702/117, 702/118, 714/700, 714/724, 714/734, 714/721, 324/763, 324/765
• US Class Current: 702/119
• CPC Class Codes: G01R 31/3004 Current or voltage test

Abstract

A computer-based test method and apparatus for measuring DC current drawn by an integrated circuit. The apparatus has a plurality of current measurement ranges and is first initialized to a selected one of the measurement ranges. Next, the apparatus measures the DC current drawn by the integrated circuit in the selected measurement range and increments the selected measurement range if the measured DC current is out of the selected measurement range. The apparatus repeats the steps of measuring and incrementing until the measured DC current is in the selected measurement range. The measured DC current is then compared to a specification limit for the integrated circuit.

Claims

1. A method of measuring DC current drawn by an integrated circuit, the method comprising:

coupling the integrated circuit to a computer-based test apparatus which has a plurality of current measurement ranges;

maintaining a software look-up table in a memory which includes an entry indicating a maximum current value for each of the plurality of measurement ranges;

initializing the computer-based test apparatus to a selected measurement range in the plurality of measurement ranges;

measuring the DC current drawn by the integrated circuit with the computer-based test apparatus in the selected measurement range;

comparing the measured DC current to the maximum current value entry in the look-up table for the selected measurement range;

incrementing the selected measurement range if the measured DC current is out of the selected measurement range, based on the comparison; and

repeating the steps of measuring and incrementing until the measured DC current is in the selected measurement range.

2. The method of claim 1 wherein the step of initializing comprises initializing the computer-based test apparatus to a lowest measurement range in the plurality of measurement ranges.

3. The method of claim 1 wherein the step of incrementing comprises increasing the selected measurement range to a next higher measurement range in the plurality of measurement ranges.

4. The method of claim 1 and further comprising:

comparing the measured DC current to a specification limit for the integrated circuit with the computer-based test apparatus when the measured DC current is in the selected measurement range; and

generating an output signal indicative of the comparison.

5. The method of claim 4 wherein the specification limit represents a current level above which the integrated circuit is considered to be defective and wherein the step of generating an output signal comprises generating a pass output signal if the measured DC current is less than the threshold level and generating a fail output signal if the measured DC current exceeds the threshold level.

6. The method of claim 1 and further comprising logging the measured DC current when the measured DC current is in the selected measurement range.

7. The method of claim 1 and further comprising:

applying electrical power to the integrated circuit; and

applying test vectors to the integrated circuit to place the integrated circuit in a desired state prior to measuring the DC current drawn by the integrated circuit.

8. The method of claim 1 and further comprising:

removing the integrated circuit from the computer-based test apparatus after the measured DC current is in the selected measurement range; and

coupling another integrated circuit to the computer-based test apparatus and repeating the steps of initializing, measuring, logging, incrementing and removing.

9. A computer-based DC current test apparatus comprising:

a test head having a receptacle for electrically coupling to an integrated circuit;

a DC current measurement circuit electrically coupled to the test head and having a plurality of measurement ranges;

a processor electrically coupled to the DC current measurement circuit;

a storage device electrically coupled to the processor; and

software means stored in the storage device and operative on the processor for;

maintaining a software look-up table in the storage device which includes an entry for each of the plurality of measurement ranges, each entry specifying the maximum current level in that measurement range; and

initializing the DC current measurement circuit to a selected measurement range in the plurality of measurement ranges;

measuring the DC current drawn by the integrated circuit with the DC current measurement circuit in the selected measurement range;

comparing the measured DC current to the maximum current level specified in the look-up table for the selected measurement range;

incrementing the selected measurement range if the measured DC current is out of the selected measurement range, based on the step of comparing; and

repeating the steps of measuring, comparing and incrementing until the measured DC current is in the selected measurement range.

10. The computer-based test apparatus of claim 9 wherein the software means is further operative on the processor for logging the measured DC current in the storage device when the measured DC current is in the selected measurement range.

11. The computer-based test apparatus of claim 9 wherein the software means is further operative on the processor for comparing the measured DC current to a specification limit when the measured DC current is in the selected measurement range.

12. The computer-based test apparatus of claim 11 wherein the software means is further operative on the processor for generating a pass output signal when the measured DC current is less than the specification limit and a fail output signal when the measured DC current exceeds the specification limit.

13. The computer-based test apparatus of claim 9 wherein:

the DC current measurement circuit comprises means for applying electrical power to the integrated circuit electrically coupled through the test head; and

the software means is operable on the processor for applying test vectors to the integrated circuit to place the integrated circuit in a desired state prior to measuring the DC current drawn by the integrated circuit.

14. A computerized method of measuring DC current drawn by an integrated circuit, the method comprising:

coupling the integrated circuit to a computer-based test apparatus which has a plurality of current measurement ranges;

initializing the computer-based test apparatus to a selected measurement range, which is the lowest measurement range in the plurality of measurement ranges, through a software program that is operable on the computer-based test apparatus;

measuring the DC current drawn by the integrated circuit with the computer-based test apparatus in the selected measurement range;

generating a range signal indicative of whether the measured DC current is in or out of the selected measurement range;

detecting the range signal with the software program;

responsively logging the measured DC current through the software program if the range signal indicates the measured DC current is in the selected measurement range;

responsively incrementing the selected measurement range through the software program if the range signal indicates the measured DC current is out of the selected measurement range;

repeating the steps of measuring, generating and incrementing through the software program until the measured DC current is in the selected measurement range;

comparing the logged, measured DC current to a specification limit for the integrated circuit through the software program with the computer-based test apparatus; and

generating an output signal indicative of the comparison.

15. The computerized method of claim 14 and further comprising:

maintaining a software look-up table in a memory which includes an entry indicating a maximum current value for each of the plurality of measurement ranges, and

wherein the step of generating a range signal comprises comparing the measured DC current to the maximum current value entry in the look-up table for the selected measurement range and outputing the range signal as a function of the comparison.

16. The computerized method of claim 14 wherein:

the step of generating a range signal comprises setting a flag output by the computer-based test apparatus when the computer-based test apparatus detects that the measured DC current is out of the selected measurement range; and

the step of responsively incrementing comprises detecting when the computer-based test apparatus sets the flag output through a software program and responsively incrementing the selected measurement range of the computer-based test apparatus with the software program if the flag output is set.