Multiple pathlength sensor for determining small particle size distribution in high particle concentrations

• US 6,104,490 A
• Filed: 12/14/1998
• Issued: 08/15/2000
• Est. Priority Date: 12/14/1998
• Status: Expired due to Fees

• Current Assignee: Microtrac, Inc. (Nikkiso Company Limited)
• Original Assignee: Microtrac, Inc. (Nikkiso Company Limited)
• Inventors: Trainer, Michael N.
• Primary Examiner(s): Font, Frank G.
• Assistant Examiner(s): Lauchman, Layla G.
• Application Number:
  US09/211,373
• Time in Patent Office: 610 Days
• Field of Search: 356/336, 356/335, 356/337, 356/342, 356/343
• US Class Current: 356/336
• CPC Class Codes: G01N 15/02 Investigating particle size or size distribution by measuring osmotic pressure G01N7/10; investigating sedimentation of particle suspensions G01N15/04; investigating individual particles G01N15/10

Abstract

A multiple pathlength sensor is disclosed that is installed substantially within a process stream containing particles at high concentrations. The sensor includes a transparent surface for receiving the first and the second light energy emissions projected by first and second light delivery arrangements. The first and second light energy emissions penetrate the transparent surface and enter the sensor in a first directional path. A first light deflecting surface modifies the first and second light energy emissions to travel into a second directional path through the sensor. A first passage exposed to the process stream is sized to receive particles of a first predetermined size range. The first light energy emission in the second directional path is projected through the first passage to irradiate the particle ensemble therein. A second passage exposed to the process stream is sized to receive particles of a second predetermined size range. The second light energy emission in the second directional path is projected through the second passage to irradiate the particle ensemble therein. A second light deflecting surface receives the light energy projected through the first and second passages and the light energy scattered by the particle ensemble in each of the first and said second passages. The second deflecting surface directionally modifies the light energy it receives to follow a third directional path through the sensor to the transparent surface, where the light energy escapes the sensor and is collected by a light collection arrangement.

Claims

1. A sensor used in an apparatus for determining the size distribution of small particles contained in a process stream, said apparatus including a first light delivery arrangement for producing and projecting an anamorphically modified first light energy emission and a second light delivery arrangement for producing and projecting an anamorphically modified second light energy emission, a light collection arrangement for collecting light energy, a detector array receiving the collected light energy and means for translating the detected light energy into particle size distribution, said sensor installed substantially within said process stream and comprising:

a) a transparent surface receiving said first and said second light energy emissions projected by said first and said second light delivery arrangements, said first and said second light energy emissions penetrating said transparent surface and entering said sensor in a first directional path;

b) a first light deflecting surface receiving said first and said second light energy emissions entering said sensor in said first directional path and modifying the direction of said first and said second light energy emissions received into a second directional path through said sensor;

c) a first passage exposed to said process stream, said first passage sized to receive particles of a first predetermined size range and said first light energy emission in said second directional path is projected through said first passage to irradiate the particle ensemble therein;

d) at least a second passage exposed to said process stream, said second passage sized to receive particles of a second predetermined size range and said second light energy emission in said second directional path is projected through said second passage to irradiate the particle ensemble therein; and

e) a second light deflecting surface receiving said light energy projected through said first and said second passages and the light energy scattered by said particle ensemble in each of said first and said second passages, said second deflecting surface directionally modifying the light energy received into a third directional path through said sensor to said transparent surface, whereby the light energy in said third directional path escapes said sensor and is collected by said light collection arrangement.

2. The sensor as claimed in claim 1, wherein said first and said second light energy emissions in said second directional path are focused within respective first and second passages.

3. The sensor as claimed in claim 2, wherein each of said first and said second passages have a width equal to the optimal pathlength required to reduce multiple scattering of said light energy focused on said particle ensemble in each passage, and each passage having a depth approximately equal to the passage width to allow exchange of particles between said process stream and each passage.

4. The sensor as claimed in claim 1, wherein said sensor is a monolithic structure generally rectangular in cross section and composed of an optically clear material, said sensor further including obliquely oriented first and second sidewalls extending longitudinally between obliquely oriented first and second end walls, said first sidewall prepared to allow the inner surface of said first sidewall to reflect light energy forming said first light deflecting surface and said second sidewall prepared to allow an inner surface of said second sidewall to reflect light energy forming said second light deflecting surface.

5. The sensor as claimed in claim 4, wherein said sensor further includes:

a) first and second top surfaces extending inwardly from a top edge of a respective first and second sidewall toward the center of said sensor defining therebetween the periphery of a first and a second channel, said first and second channels tandemly oriented along a common longitudinal axis with said first channel extending parallel to said first and second sidewalls from a first opening on said first end wall to a second opening on said second channel, and said second channel extending parallel to said first and second sidewalls from a first opening on said second end wall to said second opening of said first channel, whereby said first channel comprises said sensor'"'"'s first passage and said second channel comprises said sensor'"'"'s second passage; and

b) a planar bottom surface extending perpendicularly between said first and second side walls and said first and second end walls, said bottom surface comprising said transparent surface, whereby said sensor is oriented to allow said anamorphically modified light energy to strike said bottom surface and be transmitted into the interior of said sensor.

6. The sensor as claimed in claim 1, wherein said first light delivery arrangement and said second light delivery arrangement are sequentially activated, whereby said second light energy emission is not projected from said second light projecting arrangement until said light energy in said third directional path escaping said transparent surface and representative of said first light energy emission is collected by said light collection arrangement.

7. The sensor as claimed in claim 1, wherein said apparatus further includes a second light collection arrangement and detector array, said second light collection arrangement disposed to receive and collect the light energy scattered by said particle ensemble of said first and said second passages that are directed to and escape from said transparent surface without being first directionally modified by said second deflecting surface and representative of higher scattering angles.