Analog value memory circuit
First Claim
1. An analog value memory circuit, comprising:
- an analog memory circuit including a plurality of memory cells each including a switch element having a terminal connected to a corresponding row line and a memory capacitor connected to a first terminal of said switch element, said memory cells being arranged in a matrix of u columns and v rows, u and v being natural numbers;
v row switches arranged for the individual rows and each connected at a terminal thereof to a common input/output node and at a second terminal thereof to a terminal of the corresponding row line;
a first scanning circuit for outputting column selection signals for i columns to drive the switch elements of the memory cells for individual columns, i being equal to or larger than 1 but equal to or smaller than u;
a second scanning circuit for outputting row selection signals for j rows to drive the switch elements of the memory cells and to drive said row switches for the individual rows, j being equal to or larger than 1 but equal to or smaller than v; and
a clock generation circuit for supplying a same clock signal directly to said first and second scanning circuits;
wherein, the numbers u and v of said first and second scanning circuits being set so as to not be equal to one another and to have no common divisor other than 1.
1 Assignment
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Accused Products
Abstract
An analog delay circuit which includes an analog memory circuit wherein a plurality of memory cells each including a memory capacitor and a selection switch for the memory capacitor are arranged in a matrix includes row switches provided for the individual columns for individually being driven by row selection signals. A same clock signal from a clock generation circuit is supplied commonly to an X direction scanning circuit and a Y direction scanning circuit. The number of stages of registers of the X direction scanning circuit and the number of stages of registers of the Y direction scanning circuit are set so that they have no common divisor other than 1 Consequently, when the memory cells are to be selectively scanned, a same selection condition can be provided to all of the memory cells without relying upon the positions of the memory cells, and the parasitic capacitance connected to a signal write/read terminal is reduced.
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Citations
7 Claims
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1. An analog value memory circuit, comprising:
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an analog memory circuit including a plurality of memory cells each including a switch element having a terminal connected to a corresponding row line and a memory capacitor connected to a first terminal of said switch element, said memory cells being arranged in a matrix of u columns and v rows, u and v being natural numbers; v row switches arranged for the individual rows and each connected at a terminal thereof to a common input/output node and at a second terminal thereof to a terminal of the corresponding row line; a first scanning circuit for outputting column selection signals for i columns to drive the switch elements of the memory cells for individual columns, i being equal to or larger than 1 but equal to or smaller than u; a second scanning circuit for outputting row selection signals for j rows to drive the switch elements of the memory cells and to drive said row switches for the individual rows, j being equal to or larger than 1 but equal to or smaller than v; and a clock generation circuit for supplying a same clock signal directly to said first and second scanning circuits;
wherein, the numbers u and v of said first and second scanning circuits being set so as to not be equal to one another and to have no common divisor other than 1. - View Dependent Claims (2, 3, 4)
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5. An analog value memory circuit, comprising:
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an analog memory circuit including a plurality of memory cells each including a switch element having a terminal connected to a corresponding row line and a memory capacitor connected to the other terminal of said switch element, said memory cells being arranged in a matrix of u columns and v rows, u and v being natural numbers; a first scanning circuit for successively outputting u column selection signals to drive the switch elements of said memory cells for the individual columns; a second scanning circuit for successively outputting v row selection signals to drive the switch elements of said memory cells for the individual rows; and a clock-generation circuit for supplying a same clock signal directly to said first and second scanning circuits; the numbers u and v of said first and second scanning circuits being set so as to not be equal to one another and to have no common divisor other than 1. - View Dependent Claims (6, 7)
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Specification