Apparatus and method for calibrating a probe assembly of a measuring machine

• US 6,112,423 A
• Filed: 01/15/1999
• Issued: 09/05/2000
• Est. Priority Date: 01/15/1999
• Status: Expired due to Fees

• Current Assignee: Hexagon Metrology AB (Hexagon AB)
• Original Assignee: Brown & Sharpe Manufacturing Company (BNS Holding Incorporated)
• Inventors: Sheehan, Kenneth L.
• Primary Examiner(s): Fulton, Christopher W.
• Application Number:
  US09/231,148
• Time in Patent Office: 599 Days
• Field of Search: 33/502, 33/503, 33/555, 33/556, 33/558, 33/559, 33/561, 73/1.01
• US Class Current: 33/502
• CPC Class Codes: G01B 21/042 Calibration or calibration artifacts G01B3/30, G01B9/02072 take precedence

Abstract

A precision measuring machine, such as a coordinate measuring machine, includes a probe assembly fixed to a movable member of the machine. The probe assembly includes a probe tip. A calibration object is detachably secured to the movable member in fixed relation to the probe assembly. The probe assembly articulates into a position such that the calibration object may be probed by the probe tip to recalibrate the probe assembly.

Claims

1. A measuring machine comprising:

a frame;

a probe assembly movably coupled to said frame, said probe assembly having a probe tip; and

,

a calibration object coupled to said frame in fixed relation to said probe assembly to move therewith, with said calibration object being adapted to be probed by said probe tip for calibrating said probe assembly.

2. A measuring machine comprising:

a frame defining a measurement volume;

a movable member movably attached to said frame;

a probe assembly attached to said movable member for probing measurements of a workpiece placed in said measurement volume, said probe assembly having a probe tip; and

,

a calibration object detachably secured to said movable member in fixed relation to said probe assembly, with said calibration object being adapted to be probed by said probe tip for calibrating said probe assembly.

3. A machine according to claim 2 wherein said probe assembly articulates relative to said movable member such that said calibration object may be probed by said probe tip.

4. A machine according to claim 3 wherein said probe assembly is adapted to rotate about at least one axis.

5. A machine according to claim 3 wherein said probe assembly is adapted to rotate about at least two axes.

6. A machine according to claim 2 wherein said calibration object defines a surface having a predetermined geometric form adapted to be probed by said probe tip.

7. A machine according to claim 6 wherein said surface lies in a plane substantially perpendicular to a longitudinal axis of said movable member.

8. A machine according to claim 6 wherein said surface lies in a plane substantially parallel to a longitudinal axis of said movable member.

9. A machine according to claim 6 wherein said surface lies in a plane inclined at an angle relative to a longitudinal axis of said movable member.

10. A machine according to claim 6 wherein said surface is curved.

11. A machine according to claim 6 wherein said surface includes a plurality of steps, with a landing of each said step lying in a plane substantially perpendicular to a longitudinal axis of said movable member and with a riser of each said step lying in a plane substantially parallel to said longitudinal axis of said movable member.

12. A machine according to claim 6 wherein said surface is a frustoconical surface.

13. A machine according to claim 6 wherein said surface includes a plurality of concave surfaces, with said concave surfaces lying in a plane inclined at an angle relative to a longitudinal axis of said movable member.

14. A machine according to claim 6 wherein said surface is includes at least one sphere.

15. A machine according to claim 6 wherein said surface includes three spheres, with said spheres lying in a plane and having axes that define apexes of a substantially equilateral triangle.

16. A machine according to claim 2 further comprising a computer, with said computer causing said machine to enter a recalibration mode based a sensed condition.

17. A machine according to claim 16 wherein said sensed condition is at least one of temperature, humidity and time.

18. A machine according to claim 16 wherein said sensed condition is based on a comparison of a discrepancy and a first predetermined threshold, with said discrepancy being defined as a difference between a probed measurement and a desired measurement.

19. A machine according to claim 18 wherein said sensed condition is further based on a comparison of an accumulation of said discrepancies and a second predetermined threshold.

20. A machine according to claim 3 further comprising a computer, with said computer causing said probe assembly to articulate.

21. A machine according to claim 2 wherein said probe assembly is one of a contacting and non-contacting type probe assembly.

22. A machine according to claim 2 further comprising a computer, with said computer causing said probe tip to probe said calibration object after probing a fixed calibration object and before probing the workpiece.

23. A machine according to claim 22 wherein said computer develops an error matrix corresponding to said calibration object.

24. A calibration surface for calibrating a probe assembly of a measuring machine, the probe assembly being mounted on a movable arm of the machine and having a probe tip, with said calibration surface being positioned on the movable arm in fixed relation to the probe assembly.

25. A calibration surface according to claim 24 wherein said surface defines a plane.

26. A calibration surface according to claim 24 wherein said surface defines a curve.

27. A calibration surface according to claim 24 wherein said surface includes a plurality of planar steps.

28. A calibration surface according to claim 24 wherein said surface defines a frustoconical surface.

29. A calibration surface according to claim 24 wherein said surface includes a plurality of concave surfaces.

30. A calibration surface according to claim 24 wherein said surface includes at least one sphere.

31. A calibration surface according to claim 24 wherein said surface includes three spheres, with said spheres lying in a plane and having axes that define apexes of a substantially equilateral triangle.

32. A method of calibrating a probe assembly of a measuring machine, the measuring machine having a frame, a movable arm mounted to the frame, and the probe assembly fixed to the movable arm, the probe assembly having a probe tip, with said method comprising the steps of:

coupling a calibration object to the movable arm in fixed relation to the probe assembly;

probing said calibration object with the probe tip, to obtain a measurement;

comparing said measurement to a stored measurement; and

,

calibrating the probe assembly based on said comparison.

33. A method according to claim 32 wherein said probing step comprises the step of articulating the probe assembly into a position such that said probe tip may probe said calibration object.

34. A method according to claim 32 further comprising the steps of:

sensing an operating condition;

comparing said operating condition to a predetermined threshold; and

,

determining whether to enter a recalibration mode based on said comparison.

35. A method according to claim 34 further comprising the step of determining whether the machine required recalibration.

36. A method according to claim 35 further comprising the step of indicating whether the machine required recalibration.

37. A method according to claim 35 further comprising the step of adjusting said predetermined threshold.

38. A method according to claim 34 wherein said sensing step includes the step of sensing at least one of temperature, humidity and time.

39. A method according to claim 34 wherein said sensing step comprises the steps of:

determining a difference between a probed measurement and a desired measurement, thereby defining a discrepancy; and

,

comparing said discrepancy to a first predetermined threshold.

40. A method according to claim 37 wherein said sensing step further comprises the step of:

determining a difference between a probed measurement and a desired measurement, thereby defining a discrepancy;

accumulating a number of said discrepancies; and

,

comparing said accumulated number of discrepancies to a second predetermined threshold.

41. A method according to claim 32 further comprising the steps of:

probing a fixed calibration object; and

,

probing a workpiece, wherein said step of probing said calibration object occurs after probing said fixed calibration object and before probing the workpiece.

42. A coordinate measuring machine comprising:

a frame defining a measurement volume;

a movable member movably attached to said frame;

a probe assembly attached to said movable member for probing measurements of a workpiece placed in said measurement volume, said probe assembly having a probe tip;

a calibration object detachably secured to said movable member to move therewith and being in fixed relation to said probe assembly, with said calibration object defining a surface having a predetermined geometric form, with said probe assembly being adapted to articulate relative to said movable member about at least two axes such that said surface of said calibration object may be probed by said probe tip; and

,

a computer for causing said machine to enter a recalibration mode based a comparison between a sensed condition and a predetermined threshold and further causing said probe assembly to articulate.

43. A machine according to claim 42 wherein said surface lies in a plane substantially perpendicular to a longitudinal axis of said movable member.

44. A machine according to claim 42 wherein said surface lies in a plane substantially parallel to a longitudinal axis of said movable member.

45. A machine according to claim 42 wherein said surface lies in a plane inclined at an angle relative to a longitudinal axis of said movable member.

46. A machine according to claim 42 wherein said surface is curved.

47. A machine according to claim 42 wherein said surface includes a plurality of steps, with a landing of each said step lying in a plane substantially perpendicular to a longitudinal axis of said movable member and with a riser of each said step lying in a plane substantially parallel to said longitudinal axis of said movable member.

48. A machine according to claim 42 wherein said surface is a frustoconical surface.

49. A machine according to claim 42 wherein said surface includes a plurality of concave surfaces, with said concave surfaces lying in a plane inclined at an angle relative to a longitudinal axis of said movable member.

50. A machine according to claim 42 wherein said surface includes at least one sphere.

51. A machine according to claim 42 wherein said surface includes three spheres, with said spheres lying in a plane and having axes that define apexes of a substantially equilateral triangle.

52. A machine according to claim 42 wherein said sensed condition is at least one of temperature, humidity and time.

53. A machine according to claim 42 wherein said sensed condition is based on a comparison of a discrepancy and a first predetermined threshold, with said discrepancy being defined as a difference between a probed measurement and a desired measurement.

54. A machine according to claim 42 wherein said computer causes said probe tip to probe said calibration object after probing a fixed calibration object and before probing the workpiece.

55. A machine according to claim 42 wherein said sensed condition is based on a comparison of an accumulation of said discrepancies and a second predetermined threshold.

56. A machine according to claim 42 wherein said computer develops an error matrix corresponding to said calibration object.