Magnetic detection of short circuit defects in plate structure
First Claim
1. A method of performing short circuit detection on a plate structure in which a group of first electrical conductors are nominally electrically insulated from and, as viewed generally perpendicular to the plate structure, cross a group of second electrical conductors, the method comprising the steps of:
- performing a magnetic current-sensing operation on at least part of the first and second conductors to produce current data indicative of how much, if any, current flows through each of at least part of the conductors; and
applying a short circuit defect probability analysis to the current data in order to select a location where an identified one of the first conductors crosses an identified one of the second conductors as being most probable of having a short circuit defect.
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Accused Products
Abstract
A probability analysis technique is performed on magnetically obtained current data to detect short circuit defects in a plate structure (10) in which a group of first electrical conductors (32) are nominally electrically insulated from and cross a group of second electrical conductors (48). In particular, a magnetic current-sensing operation is performed on at least part of the conductors to produce current data indicative of how much, if any, current flows through each of at least part of the conductors. A short circuit defect probability analysis is then applied to the current data in order to select a location where one of the first conductors crosses one of the second conductors as being most probable of having a short circuit defect.
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Citations
32 Claims
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1. A method of performing short circuit detection on a plate structure in which a group of first electrical conductors are nominally electrically insulated from and, as viewed generally perpendicular to the plate structure, cross a group of second electrical conductors, the method comprising the steps of:
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performing a magnetic current-sensing operation on at least part of the first and second conductors to produce current data indicative of how much, if any, current flows through each of at least part of the conductors; and applying a short circuit defect probability analysis to the current data in order to select a location where an identified one of the first conductors crosses an identified one of the second conductors as being most probable of having a short circuit defect. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 30, 31, 32)
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- 27. A method as in claim 27 wherein the driving voltage varies with time in a generally periodic manner at approximately a selected frequency.
Specification