High resolution (quiescent) supply current system (IDD monitor)

• US 6,118,293 A
• Filed: 05/30/1997
• Issued: 09/12/2000
• Est. Priority Date: 06/05/1996
• Status: Expired due to Term

• Current Assignee: Katholieke Hogeschool Brugge-Oostende Vzw A Belgium High School
• Original Assignee: Interuniversitair Microelektronica Centrum, Katholieke Hogeschool Brugge-Oostende Vzw A Belgium High School
• Inventors: Manhaeve, Hans, Kerckenaere, Stefaan, Stopjakova, Viera
• Primary Examiner(s): Nguyen, Vinh P.
• Application Number:
  US08/866,543
• Time in Patent Office: 1,201 Days
• Field of Search: 324/763, 324/765, 324/158.1, 324/73.1, 324/537, 438/14, 438/17, 438/18, 257/40, 257/48, 340/660-663, 714/724, 714/733, 714/734, 714/735
• US Class Current: 324/750.3
• CPC Class Codes: G01R 31/3004 Current or voltage test

Abstract

The present invention relates to a system for the measurement of a supply current of an electronic circuit, comprising:

a first part with control means for applying and controlling at least one voltage and one current on said circuit;

a second part being fed by an input voltage and delivering a first output voltage and a first output current on a first terminal and a second output current on a second terminal, said first output voltage being essentially equal to said input voltage, said second output current being essentially proportional to said first output current being said supply current;

a switch in between said first and said second part, being controlled by trigger means controlled by said first part, for turning said switch off or on whereby switching said second part in measurement mode or in bypass mode.

Claims

1. A system for the measurement of the supply current of an electronic circuit, comprising:

a bypass switch adapted for connection to an input voltage, said bypass switch having a measurement mode and a bypass mode; and

,

a measurement unit connected to said bypass switch for delivering a supply voltage and a supply current to the electronic circuit when said bypass switch is in said measurement mode, wherein said supply voltage is essentially equal to the input voltage, said measurement unit further comprising a second output for providing a measurement current that is proportional to said supply current, wherein said measurement unit comprises;

an operational amplifier;

a voltage level shifter for shifting the output voltage of said operational amplifier to another level;

two complementary MOS transistors connected to said voltage level shifter, said two transistors providing said supply voltage; and

a first and second current mirror connected to said two transistors, said first and second current mirrors creating a measurement current proportional to the supply current of the electronic circuit.

2. The system as recited in claim 1 wherein said measurement unit is an integrated circuit.

3. The system as recited in claim 1 wherein said measurement unit is integrated with the electronic circuit on one integrated circuit.

4. The system as recited in claim 1 wherein said bypass switch is a compensated switch for minimizing the charge transfer from said switch to the electronic circuit.

5. The system as recited in claim 1 further comprising a current comparator for comparing said measurement current with a reference.

6. The system as recited in claim 5, further comprising a latch for retaining the output voltage of said current comparator.

7. The system as recited in claim 5 wherein said measurement unit and said current comparator are integrated with the electronic circuit on one integrated circuit.

8. The system as recited in claim 6 wherein said measurement unit, said current comparator, and said latch are integrated with the electronic circuit on one integrated circuit.

9. The system of claim 1 wherein said bypass switch selectively redirects the input voltage directly to the electronic circuit thereby bypassing said measurement unit.

10. The system of claim 1 wherein said bypass switch further comprises a trigger input adapted for receiving a trigger signal for selectively placing said bypass switch into said measurement mode and said bypass mode.

11. The system as recited in claim 1 wherein the measurement current of said current mirrors is greater than or equal to the supply current of the electronic circuit.

12. The system as recited in claim 1 wherein said current mirrors include a plurality of transistors to generate a mirrored current, said plurality of transistors being selectively activated.

13. The system of claim 1 wherein each of said complementary MOS transistors are connected to one of said current mirrors to generate said measurement current and said supply current.