Source bias compensation for page mode read operation in a flash memory device
First Claim
1. A memory comprising:
- an array of core cells, each core cell including a ground node;
a ground line coupling the ground node of each core cell to a ground potential, the ground line establishing a variable parasitic potential between a ground potential and the ground node of each core cell;
a reference core cell including a reference ground node; and
a circuit element coupled between the reference ground node and the ground potential and configured to establish a variable reference potential to match the variable parasitic potential.
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Abstract
A page mode memory senses a large number of bits simultaneously. The associated read current creates a source bias in the core cells which alters the sense margin at the sense amplifier. To address this problem, a memory integrated circuit (100) includes an array (102) of core cells, each core cell having a ground node (220, 222, 224). A ground line (230) couples the ground node of each core cell to a ground potential (Vss) and establishes a variable parasitic potential between the ground node and Vss. For sensing the data state of the core cells, a reference core cell (252) matches the array core cells and has a reference ground node (262). A circuit element (256) is coupled between the reference ground node and Vss to establish a variable reference potential to match the variable parasitic potential.
77 Citations
16 Claims
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1. A memory comprising:
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an array of core cells, each core cell including a ground node; a ground line coupling the ground node of each core cell to a ground potential, the ground line establishing a variable parasitic potential between a ground potential and the ground node of each core cell; a reference core cell including a reference ground node; and a circuit element coupled between the reference ground node and the ground potential and configured to establish a variable reference potential to match the variable parasitic potential. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method of sensing states of a plurality of core cells in a memory integrated circuit, the method comprising the steps of:
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selecting a word line of a plurality of word lines; sensing a bit line current in a selected core cell; sensing a reference current in a reference core cell; and applying a bias potential to the reference core cell to match parasitic bias in the selected core cell. - View Dependent Claims (11, 12, 13, 14)
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15. A page mode memory in which a plurality of multi-bit words are sensed substantially and presented for reading one word at a time, the page mode memory comprising:
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a core cell array including a plurality of core cells, each core cell when selected conducting one of a first current and a second current depending on stored data state of the core cell, each core cell including a parasitic element introducing a variable parasitic potential between the core cell and ground potential; a sensing circuit configured to sense stored data states of a plurality of core cells; a reference core cell configured to conduct a reference current for comparison by the sensing circuit with core cell current from selected core cells; and a circuit element coupled with the reference core cell and configured to introduce a variable reference potential in response to the variable parasitic potential. - View Dependent Claims (16)
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Specification