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Method for predicting fault conditions in an intelligent electronic device

  • US 6,121,886 A
  • Filed: 05/18/1999
  • Issued: 09/19/2000
  • Est. Priority Date: 05/18/1999
  • Status: Expired due to Fees
First Claim
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1. A method of predicting fault conditions in an intelligent electronic device having a trip event threshold, said method comprising:

  • sensing an electrical signal to provide a sensed signal indicative of an electrical characteristic of the electrical signal;

    comparing a rate of change in said sensed signal and a near-trip event threshold to detect a near-trip event, said near-trip event threshold defining said near-trip event before a potential trip event as defined by the trip event threshold of the intelligent electronic device; and

    generating a near-trip event signal when said near-trip event is detected.

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