Method for predicting fault conditions in an intelligent electronic device
First Claim
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1. A method of predicting fault conditions in an intelligent electronic device having a trip event threshold, said method comprising:
- sensing an electrical signal to provide a sensed signal indicative of an electrical characteristic of the electrical signal;
comparing a rate of change in said sensed signal and a near-trip event threshold to detect a near-trip event, said near-trip event threshold defining said near-trip event before a potential trip event as defined by the trip event threshold of the intelligent electronic device; and
generating a near-trip event signal when said near-trip event is detected.
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Abstract
A method of predicting an eminent circuit breaker trip condition using an intelligent electronic device such as a trip unit, a protective relay, a power meter or other IED is presented. The intelligent electronic device includes a microcontroller and associated memories. An algorithm (program) stored in a memory of the intelligent electronic device generates a near-trip event for each trip event calculation if preset thresholds for the measured parameters are breached.
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22 Claims
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1. A method of predicting fault conditions in an intelligent electronic device having a trip event threshold, said method comprising:
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sensing an electrical signal to provide a sensed signal indicative of an electrical characteristic of the electrical signal; comparing a rate of change in said sensed signal and a near-trip event threshold to detect a near-trip event, said near-trip event threshold defining said near-trip event before a potential trip event as defined by the trip event threshold of the intelligent electronic device; and generating a near-trip event signal when said near-trip event is detected. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. An intelligent electronic device comprising:
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a sensor for sensing an electrical signal to provide a sensed signal indicative to an electrical characteristic of the electrical signal; and a signal processor responsive to said sensed signal, and having memory for storing signals including program signals defining an executable program for, comparing a rate of change in said sensed signal and near-trip event threshold to detect a near-trip event, said near-trip event threshold defining said near-trip event before a potential trip event as defined by the trip event threshold of the intelligent electronic device, and generating a near-trip event signal when said near-trip event is detected. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
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Specification