Dual resolution combined laser spot scanning and area imaging inspection
First Claim
1. A dual resolution inspection system for inspecting a substrate, comprising:
- an illumination system comprising a light source producing an illuminating beam directed along a path to said substrate, and a deflection system for scanning said illuminating beam on at least a scan line of said substrate;
an illumination objective for focusing said illuminating beam on said substrate and for collecting light reflected therefrom whereby a collected light beam is formed, said collected light beam being angularly wider than said illuminating beam;
at least one dark field detector for detecting scattered light scattered from said substrate;
an array light detector; and
an optical system disposed between said illumination system and said illumination objective for diverting said collected light beam from an optical path connecting said illumination system and said illumination objective and focusing said collected light beam, after said collected light beam passes said illumination objective, onto said array light detector.
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Accused Products
Abstract
An optical inspection system for inspecting a substrate includes a light detector, a light source, a deflection system, an objective lens and an optical system. The light source produces an illuminating beam directed along a path to the substrate. The deflection system scans the illuminating beam on a scan line of the substrate. The objective lens focuses the illuminating beam on the substrate and coliects light reflected therefrom. The collected beam is angularly wider than the illuminating beam. The optical system directs the collected light beam along a path at least partially different than the path of the illuminating beam and focuses the collected beam on the light detector. In one embodiment, the system additionally includes at least one dark field detector for collecting light deflected from the substrate.
221 Citations
18 Claims
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1. A dual resolution inspection system for inspecting a substrate, comprising:
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an illumination system comprising a light source producing an illuminating beam directed along a path to said substrate, and a deflection system for scanning said illuminating beam on at least a scan line of said substrate; an illumination objective for focusing said illuminating beam on said substrate and for collecting light reflected therefrom whereby a collected light beam is formed, said collected light beam being angularly wider than said illuminating beam; at least one dark field detector for detecting scattered light scattered from said substrate; an array light detector; and an optical system disposed between said illumination system and said illumination objective for diverting said collected light beam from an optical path connecting said illumination system and said illumination objective and focusing said collected light beam, after said collected light beam passes said illumination objective, onto said array light detector. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A dual resolution inspection system for inspecting a substrate, comprising:
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an illumination system comprising a light source producing an illuminating beam directed along a path at an angle to said substrate, and a deflection system for scanning said illuminating beam on at least a scan line of said substrate; an illumination objective for focusing said illuminating beam on said substrate and collecting light reflected from said substrate whereby a collected light beam is formed, said collected light beam being angularly wider than said illuminating beam; at least one dark field detector for detecting scattered light scattered from said substrate; an array light detector; and an optical system disposed between said illumination system and said illumination objective for diverting said collected light beam from an optical path connecting said illumination system and said illumination objective and for focusing said collected light beam, after said collected light beam passes said illumination objective, onto said array light detector. - View Dependent Claims (11)
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12. A dual resolution inspection system for inspecting a substrate, comprising:
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an illumination system comprising a light source producing a light beam, and a deflection system for scanning said light beam on at least a scan line of said substrate; illumination optics defining an illumination path for said light beam; an illumination objective inserted in said illumination path and having a defined numerical aperture for focusing said light beam on said substrate; at lest one dark field detector for detecting scattered light scattered from said substrate; a multiple element light sensor collection optics defining a collection path for light reflected from said substrate; and a collection objective inserted in said collection path and having a defined numerical aperture larger than said numerical aperture of said illumination objective, for focusing said light beam after said light beam, passes said illumination objective, onto said multiple element light sensor. - View Dependent Claims (13)
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14. A bright-field inspection system for inspecting a substrate, comprising:
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an illumination system comprising a laser providing a laser beam, and a deflection system for scanning said laser beam on at least a scan line of said substrate; illumination optics defining an illumination path for said laser beam and focusing said laser beam on said substrate at an acute incidence angle, said illumination optics having a defined illumination numerical aperture; collection optics situated to collect light reflected at an acute angle opposite said acute incidence angle and defining a collection path, said collection optics having a defined collection numerical aperture larger than said illumination numerical aperture; and an array light detector situated in said collection path. - View Dependent Claims (15, 16, 17)
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18. A dual resolution inspection system for inspecting a semiconductor wafer, comprising:
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an illumination system comprising a light source for producing an illumination beam at an acute angle to said substrate, and a deflection system for scanning said illumination beam on at least a scan line of said substrate; an illumination objective for focusing said illumination beam on said substrate and having a defined illumination numerical aperture; at least one dark field detector for detecting scattered light scattered from said semiconductor wafer, said dark field detector located at a spatial angle from specular reflection of said illumination beam; a collection objective for collecting light reflected from said substrate whereby a collected light beam is formed, said collection objective having a defined collection numerical aperture larger than said illumination numerical aperture; and an array light detector receiving said collected light beam.
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Specification