Apparatus for measuring the reflectance of strips having non-uniform color

• US 6,124,585 A
• Filed: 10/27/1998
• Issued: 09/26/2000
• Est. Priority Date: 10/27/1998
• Status: Expired due to Fees

• Current Assignee: UMM Electronics, Inc. (Nortech Systems, Inc.)
• Original Assignee: UMM Electronics, Inc. (Nortech Systems, Inc.)
• Inventors: Riedel, Richard A., Hutchison, James S.
• Primary Examiner(s): Allen, Stephone B.
• Application Number:
  US09/179,500
• Time in Patent Office: 700 Days
• Field of Search: 250/205, 250/208.1, 250/208.2, 250/339.11, 250/559.4, 356/444, 356/445, 356/446
• US Class Current: 250/208.1
• CPC Class Codes: G01N 21/4738 Diffuse reflection precedence is given to G01N21/55 - G01N21/57 if specular component is taken into consideration, e.g. also for testing fluids, fibrous materials
• CPC Class Codes: G01N 21/8483 Investigating reagent band test-element handling not specific to a test method G01N33/4875; analytical elements specific to chemical analysis of biological material G01N33/52; autometer with reagent band G01N35/04

Abstract

An optical system for measuring the reflectance of flat strips having potentially optically non-uniform surfaces. In one embodiment the systems includes an array of discrete light sources, wherein each light source is driven by its own individual current, such that the pattern reflected onto a photodector is substantially uniform in intensity.

Claims

1. A reflectance gauge, comprising:

a housing;

a circuit board mounted inside the housing;

a plurality of discrete illumination sources oriented in a predetermined pattern and mounted on the circuit board;

a slit formed in the circuit board;

an optical detector array mounted beneath the circuit board;

a first mirror coupled to the housing below the slit;

a focusing lens adapted to receive light from the first mirror;

a second mirror mounted below the circuit board and positioned to direct light from the focusing lens to the optical detector array.

2. The gauge of claim 1 further comprising flat optical sample holder formed in the housing and adapted to receive light from the plurality of discrete illumination sources.

3. The gauge of claim 1 wherein each of the discrete illumination sources is driven by a separate predetermined current.

4. The gauge of claim 3 further comprising:

a flat optical sample holder formed in the housing having a flat optical sample held therein;

wherein a light pattern is generated by the set of discrete illumination sources and wherein the light pattern is adapted to reflect with substantially even intensity onto the optical detector array.

5. The gauge of claim 1 further comprising a microprocessor coupled to the detector array, wherein the microprocessor is adapted to receive and store data from the detector array.

6. The gauge of claim 1 further comprising a data output means coupled to the detector array.

7. The gauge of claim 1 wherein the light sources are LEDs.

8. A reflectance gauge comprising:

a circuit board having a top side, a bottom side, and a slit formed therethrough;

a plurality of LEDs mounted in a predetermined pattern to the top side of the circuit board;

an optical detector array mounted to the bottom side of the circuit board;

a flat optical sample mounted above the circuit board and positioned to reflect light shining from the LEDs through the slit; and

a pair of mirrors mounted below the circuit board and positioned to direct light from the slit to the detector;

wherein each LED is driven by an independent predetermined current and wherein the light shining from the set of LEDs forms an emission pattern.

9. The reflectance gauge of claim 8 wherein the emission pattern is adapted to reflect onto the optical detector array with substantially uniform intensity.

10. The reflectance gauge of claim 8 further comprising a focusing lens positioned between the mirrors.

11. The reflectance gauge of claim 8 wherein the emission pattern is determined by the geometric pattern of the LEDs and the independent current driving each LED.

12. The reflectance gauge of claim 11 wherein the emission pattern is adapted to illuminate the flat optical sample with substantially uniform intensity.

13. The reflectance gauge of claim 8 wherein the emission pattern shining on the flat optical sample has a substantially uniform intensity.

14. The reflectance gauge of claim 8 wherein the emission pattern reflected onto the detector array has a substantially uniform intensity.

15. An optical measurement device, comprising:

a flat optical sample;

an LED array having a predetermined pattern adapted to illuminate the flat optical sample; and

an optical detector array positioned to receive light from the LED array reflected by the flat optical sample;

wherein each LED is driven by an independent predetermined current and wherein the flat optical sample is illuminated to reflect light with substantially constant intensity onto the optical detector array.

16. The device of claim 15 wherein the LED array and the optical detector array are mounted to opposite sides of the same circuit board.

17. The device of claim 15 further comprising a focusing lens, wherein the light reflected from the flat optical sample is focused through the lens onto the detector array.

18. The device of claim 15 further comprising a mirror, wherein the light reflected by the flat optical sample is directed by the mirror onto the detector array.

19. The device of claim 15 further comprising an optical barrier situated between the LED array and the detector array.