×

Element and apparatus for attenuated total reflection measurement, and method for measuring specific component using the same

  • US 6,128,091 A
  • Filed: 08/25/1998
  • Issued: 10/03/2000
  • Est. Priority Date: 08/26/1997
  • Status: Expired due to Term
First Claim
Patent Images

1. An attenuated total reflection element which permits an incident beam to enter therein and to have an internal total reflection at the surface, comprising a projection protruded at the portion where said incident beam has said internal total reflection, and said projection having a height of 1 μ

  • m to 200 μ

    m.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×