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Particle measuring apparatus

  • US 6,133,995 A
  • Filed: 05/01/1998
  • Issued: 10/17/2000
  • Est. Priority Date: 05/09/1997
  • Status: Expired due to Term
First Claim
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1. A particle measuring apparatus comprising:

  • characteristic parameter extracting means for extracting a plurality of characteristic parameters from each particle in a sample;

    distribution diagram preparing means for preparing at least one first distribution diagram on the basis of the extracted characteristic parameters;

    first separating means for separating a cluster including target particles from other information on the prepared at least one distribution diagram;

    discriminating means for calculating a discrimination function for the separated cluster including the target particles and for discriminating target particles from non-target particles in the cluster on the basis of a distance from the calculated discrimination function; and

    counting means for counting the number of the target particles discriminated by the discriminating means.

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