Instrument and method for spectroscopic analysis by reflectance and transmittance

• US 6,137,108 A
• Filed: 06/17/1998
• Issued: 10/24/2000
• Est. Priority Date: 06/17/1998
• Status: Expired due to Fees

• Current Assignee: Foss Nirsystems, Inc. (Metrohm Stiftung)
• Original Assignee: Foss Nirsystems, Inc. (Metrohm Stiftung)
• Inventors: Hall, Jeffrey W., DeThomas, Frank A., VonBargen, Ken
• Primary Examiner(s): Evans, F. L.
• Application Number:
  US09/098,539
• Time in Patent Office: 860 Days
• Field of Search: 356/445-448, 356/336, 356/342, 356/337-341, 356/410, 356/440, 356/335, 356/338, 356/339, 356/432-439, 356/441-444, 356/73, 250/574, 250/227.11-227.24, 250/341.2, 250/341.8, 250/339.07, 250/339.09, 250/339.11, 250/339.12, 385/12, 385/13
• US Class Current: 250/339.07
• CPC Class Codes: G01J 3/42 Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry beam switching arrangements G01J3/08

Abstract

A probe for a spectrometer has a slot for receiving a sample, an illuminating fiber optic bundle directing light to the sample in the slot, and first and second collecting fiber optic bundles transmitting light from the sample to the spectrometer, wherein the first collection fiber optic bundle is positioned to optimize the collection of transmitted light without scattering through the sample, and the second collection fiber optic bundle is positioned to optimize the collection of light diffusely reflected from the sample. In one embodiment, the first collection bundle is arranged in an annulus around the illuminating bundle, and the second collection bundle is arranged in an annulus around the first collection bundle. In a second embodiment, the second collection bundle is arranged in an annulus around the illuminating bundle, and the first collection bundle terminates in an interface with the sample located across the slot from the illuminating bundle and the second collection bundle.

Claims

1. A probe for an spectrometer for measuring a sample comprising:

a body defining a slot for receiving the sample;

a specularly reflecting surface on one side of said slot;

means for directing light into the sample received in the slot toward said reflecting surface;

a first optical fiber arrangement positioned to collect light reflected from said reflecting surface back through said slot and primarily transmitted through said sample without scattering and transmitting the collected light to a light detector;

a second optical fiber arrangement positioned to collect primarily light diffusely reflected from the sample in the slot and transmitting the collected light to a light detector;

said second fiber optic arrangement having a distal end at said slot shaped in an annulus around said first optical fiber arrangement.

2. The probe of claim 1, wherein the first optical fiber arrangement comprises a first fiber optic bundle and the second optical fiber arrangement comprises a second fiber optic bundle.

3. The probe of claim 1, wherein said means for directing light, the first optical fiber arrangement, and the second optical fiber arrangement have interfaces with the slot and, at the interfaces, and the first optical fiber arrangement is in an annulus around said means for directing light.

4. The probe of claim 1, wherein the means for directing light comprises means for directing infrared light.

5. A spectrometer for analyzing a sample having infrared absorbance properties comprising:

an infrared light source;

a light detector for converting the intensity of light incident thereon into an electrical signal;

a probe having a body defining a slot receiving a sample to be measured;

an illuminating fiber optic arrangement directing light from the light source into the sample received in the slot;

a first collection fiber optic arrangement transmitting to the light detector primarily light transmitted without scattering through the sample in the slot; and

a second collection fiber optic arrangement transmitting to the light detector primarily light diffusely reflected from the sample in the slot;

means defining a light path extending from said light source through said illuminating fiber optic arrangement into said slot, and through said first or second collection fiber optic arrangement, to said detector;

means forming part of said light path to disperse light transmitted in said light path into a spectrum for spectroanalysis; and

an analyzer receiving said electrical signal and operable to translate said electrical signal into information regarding the infrared absorbance properties of the sample in said slot.

6. The spectrometer of claim 5, wherein the first collection optical fiber arrangement comprises a first fiber optic bundle and the second collection optical fiber arrangement comprises a second fiber optic bundle.

7. A spectrometer as recited in claim 5, further comprising a third collection fiber optic arrangement, means to selectively transmit light from said source through said third fiber optic arrangement to provide a reference for said spectroanalysis.

8. A spectrometer as recited in claim 5 further comprising a beam selector positioned to receive light from said first and second collection fiber optic arrangements and being operable to selectively pass light received from said first collection fiber optic arrangement or received from said second collection fiber optic arrangement to said means to disperse light.

9. A spectrometer for analyzing a sample comprising:

a light source;

a light detector;

a probe having a body defining a slot receiving a sample to be measured;

an illuminating fiber optic arrangement directing light from the light source into the sample received in the slot;

a first collection fiber optic arrangement transmitting to the light detector primarily light transmitted without scattering through the sample in the slot; and

a second collection fiber optic arrangement transmitting to the light detector primarily light diffusely reflected from the sample in the slot;

means to disperse light from said light source into a spectrum for spectroanalysis;

said first collection optical fiber arrangement comprising a first fiber optic bundle and said second collection fiber optic arrangement comprising a second fiber optic bundle;

said illuminating fiber optic arrangement and the first and second collection fiber optic arrangements having interfaces with the slot and, at the interfaces, the first collection fiber optic arrangement being in an annulus around the illuminating fiber optic arrangement, and the second collection fiber optic arrangement being in an annulus around the first collection fiber optic arrangement.

10. The spectrometer of claim 9, wherein the interfaces are all positioned on one side of the slot, the spectrometer further comprising a reflector positioned across the slot from the interfaces.

11. A spectrometer for analyzing a sample comprising:

a light source;

a light detector;

a probe having a body defining a slot receiving a sample to be measured;

an illuminating fiber optic arrangement directing light from the light source into the sample received in the slot;

a first collection fiber optic arrangement transmitting to the light detector primarily light transmitted without scattering through the sample in the slot; and

a second collection fiber optic arrangement transmitting to the light detector primarily light diffusely reflected from the sample in the slot;

means to disperse light from said light source into a spectrum for spectroanalysis;

said first collection optical fiber arrangement comprising a first fiber optic bundle and said second collection fiber optic arrangement comprising a second fiber optic bundle;

said illuminating fiber optic arrangement and the first and second collection fiber optic arrangements having interfaces with the slot and, at the interfaces, the second collection fiber optic arrangement being in an annulus around the illuminating fiber optic arrangement, and the first collection fiber optic arrangement being positioned on an opposite side of the slot from the interfaces of the illuminating fiber optic arrangement and the second collection fiber optic arrangement.

12. A method of measuring a material having infrared absorbance properties undergoing change in its light transmittance and reflectance characteristics comprising:

positioning in the material a probe having a slot such that the material is in the slot;

directing infrared light into the material in the slot;

detecting with the probe any of the light transmitted without scattering through the material in the slot by sending such transmitted light to a detector through a first fiber optic arrangement having a first interface with the material in the slot, wherein the first interface is positioned to optimize reception of such transmitted light; and

detecting with the probe light diffusely reflected from the material in the slot by sending such reflected light to the detector through a second fiber optic arrangement having a second interface with the material in the slot, wherein the second interface is positioned to optimize reception of such reflected light;

analyzing said material by spectroanalysis by means of the light transmitted through said first fiber optic arrangement or the light transmitted through said second fiber optic arrangement, said analyzing including translating the light detection by said probe into information regarding the infrared absorbance properties of said material in the slot.

13. A spectrometer for analyzing a sample having an infrared absorbance property comprising an infrared light source, a light detector for converting the intensity of light incident thereon into an electric signal, a probe having a body defining a slot receiving a sample to be measured, a first illuminating fiber arrangement directing light from the light source into the sample received in the slot, a second illuminating fiber arrangement for directing light from said source into the sample received in the slot, a collection fiber optic arrangement transmitting to the light detector light introduced into the sample in said slot from said first illuminating fiber optic arrangement or introduced into the sample in said slot from said second illuminating fiber optic arrangement, said first illuminating fiber optic arrangement being positioned relative to said collection fiber optic arrangement so that light introduced into the sample in said slot from said first illuminating optic fiber arrangement and received by said collection fiber optic arrangement is primarily light transmitted through said slot without scattering, said second illuminating fiber optic arrangement being positioned relative to said collection fiber optic arrangement so that light introduced into the sample in said slot from said second illuminating fiber optic arrangement and received by said collection fiber optic arrangement is primarily light diffusely reflected from the sample in said slot, means to selectively introduce light from said source into said first illuminating fiber optic arrangement or said second fiber optic arrangement, means defining a light path extending from said light source through said first or second illuminating fiber optic arrangement, into said slot, and through said collection fiber optic arrangement to said light detector, means to disperse light transmitted in said light path into a spectrum for spectral analysis.